Park, S.-H.; Kim, M.-S.; Rhee, J.; Lee, S.-H.; Kim, J.K.; Oh, S.-H.; Sung, T.-E.
Predicting Patent Life Using Robust Ensemble Algorithm. Sustainability 2025, 17, 9658.
https://doi.org/10.3390/su17219658
AMA Style
Park S-H, Kim M-S, Rhee J, Lee S-H, Kim JK, Oh S-H, Sung T-E.
Predicting Patent Life Using Robust Ensemble Algorithm. Sustainability. 2025; 17(21):9658.
https://doi.org/10.3390/su17219658
Chicago/Turabian Style
Park, Sang-Hyeon, Min-Seung Kim, Jaewon Rhee, Sang-Hwa Lee, Jeong Kyu Kim, Si-Hyun Oh, and Tae-Eung Sung.
2025. "Predicting Patent Life Using Robust Ensemble Algorithm" Sustainability 17, no. 21: 9658.
https://doi.org/10.3390/su17219658
APA Style
Park, S.-H., Kim, M.-S., Rhee, J., Lee, S.-H., Kim, J. K., Oh, S.-H., & Sung, T.-E.
(2025). Predicting Patent Life Using Robust Ensemble Algorithm. Sustainability, 17(21), 9658.
https://doi.org/10.3390/su17219658