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Journal: World Electr. Veh. J., 2024
Volume: 15
Number: 102

Article: BI-TST_YOLOv5: Ground Defect Recognition Algorithm Based on Improved YOLOv5 Model
Authors: by Jiahao Qin, Xiaofeng Yang, Tianyi Zhang and Shuilan Bi
Link: https://www.mdpi.com/2032-6653/15/3/102

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