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Materials2012, 5(3), 364-376;https://doi.org/10.3390/ma5030364

Journal: MaterialsVolume: 5Number: 364

Article: X-ray Photoelectron Spectroscopy (XPS) Depth Profiling for Evaluation of La₂Zr₂O₇ Buffer Layer Capacity

Authors:
Vyshnavi Narayanan,
Klaartje De Buysser^* and
Els Bruneel
et al.

Link: https://www.mdpi.com/1996-1944/5/3/364

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