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Journal: Materials, 2012
Volume: 5
Number: 364
Article:
X-ray Photoelectron Spectroscopy (XPS) Depth Profiling for Evaluation of La2Zr2O7 Buffer Layer Capacity
Authors:
by
Vyshnavi Narayanan, Klaartje De Buysser, Els Bruneel and Isabel van Driessche
Link:
https://www.mdpi.com/1996-1944/5/3/364
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