Irradiation-Induced Defect Engineering in REBCO Coated Conductors: Mechanisms, Effects, and Perspectives
Abstract
1. Introduction
2. Fundamentals of Irradiation Physics
2.1. Electronic Energy Loss (EEL) and Nuclear Energy Loss (NEL)
2.2. SRIM and dpa Calculation Methods
3. Proton Irradiation
3.1. Types of Defects Induced
3.2. Mechanism of Defect-Induced Pinning Forces
3.3. Effect of Proton Irradiation on REBCO Properties
4. Fast Heavy Ion Irradiation
4.1. Defect Characteristics of Heavy Ion Irradiation
4.2. Differences Among Various Configurations of Columnar Defects



4.3. Effects of Heavy Ion Irradiation on Performance
5. Neutron Irradiation
5.1. Types and Characteristics of Defects Induced by Neutron Irradiation
5.2. Effects of Neutron Irradiation on Current-Carrying Performance
5.3. Effects on the Critical Transition Temperature and the Irreversibility Line
5.4. Energy-Dependent Effects of Neutron Irradiation
6. Mixed Irradiation
6.1. Dual-Region Enhancement of Critical Current Density
6.2. Significant Reduction of Anisotropy
6.3. Defect Competition and Creep Effects
7. Conclusions and Future Perspectives
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
References
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| Comparison Item | Low-Energy Proton Irradiation | High-Energy Proton Irradiation |
|---|---|---|
| Typical energy range | 0.1–5 MeV | 10–200 MeV |
| Dominant energy loss mechanism | Nuclear energy losses are absolutely dominant | Electronic energy loss dominates; nuclear loss contributes slightly but produces discrete severe damage |
| Main defect types | Mainly point defects (vacancies, interstitials), possibly aggregating into dislocation loops | Nanoscale dislocation clusters, sparsely distributed columnar or chain-like defects |
| Defect distribution characteristics | Localized shallow distribution, with damage concentrated on the film surface or near the protective layer | Irradiation penetrates the entire superconducting layer (when the film is thin), and the defect distribution is relatively uniform |
| Effect on lattice structure | Local lattice expansion and microstrain increase; lattice parameter slightly enlarged | The lattice parameters and microstrain increase more with low-energy protons, but the overall lattice strain remains small |
| variation trend | Remains unchanged at lower fluence, then decreases linearly | As the fluence increases, it generally shows a linear decreasing trend |
| variation trend | remains nearly constant at low fluence; weak point pinning centers slightly enhance at low fields; improvement limited at high fields | Strong bulk pinning centers generated; significantly enhanced under high fields and low temperatures, but decreases at excessive fluence |
| Flux pinning characteristics | Dominated by zero-dimensional pinning (point defects) | Enhanced one-dimensional or quasi-one-dimensional pinning (defect chains), improving high-field performance |
| Main application target | Surface damage simulation and low-energy particle shielding studies | High-field performance optimization and irradiation tolerance evaluation |
| Typical experimental result | enhancement limited under low-field and low-temperature conditions | significantly enhanced in high-field region with stronger pinning force |
| Comparison Item | Low-Energy Heavy-Ion Irradiation | High-Energy Heavy-Ion Irradiation |
|---|---|---|
| Typical energy range | 100 keV–5 MeV | 100 MeV–1 GeV |
| Dominant energy loss mechanism | Dominated by NEL near surface; electronic loss plays a secondary role | Strongly dominated by EEL, generating high ionization and displacement cascades |
| Main defect types | Surface amorphous layer, point and cluster defects | Columnar defects and amorphous tracks, sometimes discontinuous or splayed |
| Defect distribution characteristics | Localized in near-surface region; shallow penetration (tens of nm) | Penetrates through entire superconducting layer; high uniformity of columnar tracks |
| Effect on lattice structure | Surface amorphization and increased disorder; partial oxygen depletion | Formation of extended amorphous columns (5–10 nm dia., 100–500 nm long); lattice distortion but overall crystalline framework retained |
| variation trend | Slight decrease due to local disorder and oxygen loss | Slight to moderate reduction (1–5 K) depending on fluence |
| variation trend | Slight enhancement at low field due to increased point pinning | Significant enhancement (2–3×) under high magnetic fields (>5 T) and at low T |
| Flux pinning characteristics | Dominated by point and short-range pinning; isotropic pinning behavior | Strong correlated pinning along c-axis; reduced anisotropy; enhanced high-field pinning force |
| Main application target | Surface modification and defect-engineering studies | High-field magnet design; directional correlated pinning optimization |
| Typical experimental result | Partial amorphization at surface; limited improvement | Formation of uniform columnar tracks observed by TEM; strong enhancement verified experimentally |
| Comparison Item | Low-Energy Neutron Irradiation | High-Energy Neutron Irradiation |
|---|---|---|
| Typical energy range | Thermal–slow neutrons (<0.5 eV) | Fast–high-energy neutrons (>0.1 MeV) |
| Dominant energy loss mechanism | Mainly neutron capture (n,) reactions and elastic scattering | Inelastic scattering and knock-on collisions causing atomic displacements |
| Main defect types | Oxygen vacancies, point defects, and light cluster formation | Dense displacement cascades, defect clusters, and nanometric collision cascades |
| Defect distribution characteristics | Relatively uniform but low-density damage; localized near oxygen sublattice | Uniform volumetric damage through entire thickness; deeper penetration and higher defect density |
| Effect on lattice structure | Minor oxygen deficiency and local lattice expansion; limited strain | Strong atomic displacements causing microstrain and lattice distortion at high fluence |
| variation trend | Nearly unchanged at low fluence; slight reduction with increasing fluence | Noticeable decrease in (up to 5–10 K) at high fluence due to oxygen loss and disorder |
| variation trend | Slight enhancement at low and intermediate fields due to increased point pinning | Significant enhancement of under high magnetic fields; saturation or decline at excessive fluence |
| Flux pinning characteristics | Random isotropic pinning centers formed by point defects | Enhanced isotropic pinning and suppression of anisotropy; improved vortex stability |
| Main application target | Simulation of reactor neutron environments; stability evaluation | Enhancement of high-field performance and radiation-hard design for magnets |
| Typical experimental result | Moderate enhancement and nearly constant at low fluence | shifts upward; improved performance in high-field regime |
| Irradiation Type | Author (Year) | Sample | Irradiation Energy | Optimal Fluence | Improvement in |
|---|---|---|---|---|---|
| Proton | Arya A. Soman et al. (2024) [46] | (Y, Dy)Ba2Cu3O7−δ | 1.2 MeV/2.5 MeV | p/cm2/ p/cm2 | At 20 K, 8 T, isotropic increased by ∼2.6× |
| Proton | Toshinori Ozaki et al. (2021) [19] | FeSe0.5Te0.5 | 1.5 MeV | p/cm2 | At 5–10 K and <1 T, increased by ∼30% |
| Proton | Jia Y. et al. (2013) [106] | YBCO coated conductors | 4 MeV | p/cm2 | At 27 K, 6 T, increased by 1.8–2.0× |
| Heavy Ion | Gu et al. (2021) [107] | YBCO doped with Ta, Zr, Hf, Mn, Sn | 1.9 GeV Ta ions | ions/cm2 | At 30 K, 1 T, increased by 4.4× |
| Heavy Ion | A. Kujur et al. (2015) [108] | YBCO + 5 wt.% Y2O3 | 200 MeV Ag ions | ions/cm2 | At 40 K, 0.04 T, increased by 2.48× |
| Heavy Ion | Martin W. Rupich et al. (2016) [109] | 1.2 μm MOD YBCO (Dy2O3-doped) | 16–18 MeV Au ions | ions/cm2 | 77 K self-field decreased by ∼35%; but increased >2× in 4–50 K and >1 T (H//c) |
| Neutron | M. Eisterer et al. (2024) [110] | Mixed fast (>0.1 MeV) and thermal (<0.55 eV) neutrons | Mixed spectrum | Low fluence m−2s−1; to high fluence m−2 | Collision cascades enhanced pinning; maximum theoretical gain ∼30% |
| Neutron | D. X. Fischer et al. (2018) [104] | SuperPower GdBCO tapes | Thermal 29%, fast 36% | Low fluence to high fluence m−2 | At 30 K, 15 T, increased at low fluence before saturation |
| Irradiation Type | Dominant Energy Loss | Main Defect Types | Defect Scale & Morphology | Effect on / | Advantages | Limitations |
|---|---|---|---|---|---|---|
| Proton | Mainly NEL (minor EEL) | Point defects, small clusters | Random, nanoscale (1–5 nm) | Enhances at low T (<30 K), isotropic pinning; high fluence → drop | High controllability, low cost, uniform damage | Weak at high T; over-fluence induces disorder |
| Heavy Ion | Dominant EEL | Columnar defects, amorphous tracks | Continuous or discontinuous tracks (5–10 nm dia., 100–500 nm long) | Strong c-axis pinning; 2–3× gain under >5 T; slight reduction | Powerful correlated pinning; tunable directionality | High anisotropy; costly; local amorphization |
| Neutron | Elastic & inelastic collisions (NEL) | Cascade defects, clusters | Random isotropic defects (few nm), deep penetration | Moderate enhancement; isotropy improved; decreases with fluence | Deep uniform damage; wide T–B range | Poor control; radiation hazard; loss |
| Mixed (e.g., p + ion) | Combined EEL + NEL | Point + columnar + dislocation loops | Multiscale, partially correlated | Dual-region boost; isotropy improved; up; stable creep | Synergistic pinning; wide applicability | Complex control; defect competition; reproducibility issues |
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Li, Y.; Liu, N.; Guo, Z.; Chen, L.; Gong, D.; Wang, D.; Ma, Y. Irradiation-Induced Defect Engineering in REBCO Coated Conductors: Mechanisms, Effects, and Perspectives. Materials 2026, 19, 300. https://doi.org/10.3390/ma19020300
Li Y, Liu N, Guo Z, Chen L, Gong D, Wang D, Ma Y. Irradiation-Induced Defect Engineering in REBCO Coated Conductors: Mechanisms, Effects, and Perspectives. Materials. 2026; 19(2):300. https://doi.org/10.3390/ma19020300
Chicago/Turabian StyleLi, Yuxiang, Ningning Liu, Ziheng Guo, Liangkang Chen, Dongliang Gong, Dongliang Wang, and Yanwei Ma. 2026. "Irradiation-Induced Defect Engineering in REBCO Coated Conductors: Mechanisms, Effects, and Perspectives" Materials 19, no. 2: 300. https://doi.org/10.3390/ma19020300
APA StyleLi, Y., Liu, N., Guo, Z., Chen, L., Gong, D., Wang, D., & Ma, Y. (2026). Irradiation-Induced Defect Engineering in REBCO Coated Conductors: Mechanisms, Effects, and Perspectives. Materials, 19(2), 300. https://doi.org/10.3390/ma19020300

