Mastellone, M.; Pace, M.L.; Curcio, M.; Caggiano, N.; De Bonis, A.; Teghil, R.; Dolce, P.; Mollica, D.; Orlando, S.; Santagata, A.;
et al. LIPSS Applied to Wide Bandgap Semiconductors and Dielectrics: Assessment and Future Perspectives. Materials 2022, 15, 1378.
https://doi.org/10.3390/ma15041378
AMA Style
Mastellone M, Pace ML, Curcio M, Caggiano N, De Bonis A, Teghil R, Dolce P, Mollica D, Orlando S, Santagata A,
et al. LIPSS Applied to Wide Bandgap Semiconductors and Dielectrics: Assessment and Future Perspectives. Materials. 2022; 15(4):1378.
https://doi.org/10.3390/ma15041378
Chicago/Turabian Style
Mastellone, Matteo, Maria Lucia Pace, Mariangela Curcio, Nicola Caggiano, Angela De Bonis, Roberto Teghil, Patrizia Dolce, Donato Mollica, Stefano Orlando, Antonio Santagata,
and et al. 2022. "LIPSS Applied to Wide Bandgap Semiconductors and Dielectrics: Assessment and Future Perspectives" Materials 15, no. 4: 1378.
https://doi.org/10.3390/ma15041378
APA Style
Mastellone, M., Pace, M. L., Curcio, M., Caggiano, N., De Bonis, A., Teghil, R., Dolce, P., Mollica, D., Orlando, S., Santagata, A., Serpente, V., Bellucci, A., Girolami, M., Polini, R., & Trucchi, D. M.
(2022). LIPSS Applied to Wide Bandgap Semiconductors and Dielectrics: Assessment and Future Perspectives. Materials, 15(4), 1378.
https://doi.org/10.3390/ma15041378