Ichiba, K.; Okazaki, K.; Takebuchi, Y.; Kato, T.; Nakauchi, D.; Kawaguchi, N.; Yanagida, T.
X-ray-Induced Scintillation Properties of Nd-Doped Bi4Si3O12 Crystals in Visible and Near-Infrared Regions. Materials 2022, 15, 8784.
https://doi.org/10.3390/ma15248784
AMA Style
Ichiba K, Okazaki K, Takebuchi Y, Kato T, Nakauchi D, Kawaguchi N, Yanagida T.
X-ray-Induced Scintillation Properties of Nd-Doped Bi4Si3O12 Crystals in Visible and Near-Infrared Regions. Materials. 2022; 15(24):8784.
https://doi.org/10.3390/ma15248784
Chicago/Turabian Style
Ichiba, Kensei, Kai Okazaki, Yuma Takebuchi, Takumi Kato, Daisuke Nakauchi, Noriaki Kawaguchi, and Takayuki Yanagida.
2022. "X-ray-Induced Scintillation Properties of Nd-Doped Bi4Si3O12 Crystals in Visible and Near-Infrared Regions" Materials 15, no. 24: 8784.
https://doi.org/10.3390/ma15248784
APA Style
Ichiba, K., Okazaki, K., Takebuchi, Y., Kato, T., Nakauchi, D., Kawaguchi, N., & Yanagida, T.
(2022). X-ray-Induced Scintillation Properties of Nd-Doped Bi4Si3O12 Crystals in Visible and Near-Infrared Regions. Materials, 15(24), 8784.
https://doi.org/10.3390/ma15248784