Next Article in Journal
Mg2+ Doping Effects on the Structural and Dielectric Properties of CaCu3Ti4O12 Ceramics Obtained by Mechanochemical Synthesis
Next Article in Special Issue
Nanoscale Piezoelectric Properties and Phase Separation in Pure and La-Doped BiFeO3 Films Prepared by Sol–Gel Method
Previous Article in Journal
Improved Breakdown Strength of Polypropylene Film by Polycyclic Compounds Addition for Power Capacitors
Previous Article in Special Issue
Origin of Mangetotransport Properties in APCVD Deposited Tin Oxide Thin Films
Open AccessArticle

Hot-Probe Characterization of Transparent Conductive Thin Films

Engineering Faculty, Holon Institute of Technology (HIT), Holon 5810201, Israel
Academic Editor: habil. Erwan Rauwel
Materials 2021, 14(5), 1186;
Received: 8 February 2021 / Revised: 26 February 2021 / Accepted: 26 February 2021 / Published: 3 March 2021
(This article belongs to the Special Issue Metal Oxide Thin Film: Synthesis, Characterization and Application)
Transparent conductive oxide (TCO) thin films represent a large class of wide-bandgap semiconductors applied in all fields of micro- and optoelectronics. The most widespread material applied for the creation of TCO coatings is indium-tin oxide (ITO). At the same time, there are plurality trends to change the high-cost ITO on other materials, for example, on the ZnO doped by different elements such as Al, Mn, and Sb. These films require mobile and low-cost evaluation methods. The dynamic hot-probe measurement system is one of such techniques that can supplement and sometimes replace existing heavy systems such as the Hall effect measurements or the Haynes–Shockley experiments. The theoretical basis and the method of analysis of the recorded dynamic hot-probe characteristics measured at different temperatures were presented in this work. This method makes it possible to extract the main parameters of thin films. Commercial thin ITO films and new transparent conducting ZnO:Al layers prepared by magnetron co-sputtering were studied by the proposed method. The measured parameters of commercial ITO films are in agreement with the presented and reference data. In addition, the parameters of ZnO:Al thin films such as the majority charge carriers type, concentration, and mobility were extracted from dynamic hot-probe characteristics. This method may be applied also to other wide-bandgap semiconductors. View Full-Text
Keywords: dynamic hot-probe measurements; indium-tin oxide; aluminum-zinc oxide; magnetron co-sputtering dynamic hot-probe measurements; indium-tin oxide; aluminum-zinc oxide; magnetron co-sputtering
Show Figures

Figure 1

MDPI and ACS Style

Axelevitch, A. Hot-Probe Characterization of Transparent Conductive Thin Films. Materials 2021, 14, 1186.

AMA Style

Axelevitch A. Hot-Probe Characterization of Transparent Conductive Thin Films. Materials. 2021; 14(5):1186.

Chicago/Turabian Style

Axelevitch, Alexander. 2021. "Hot-Probe Characterization of Transparent Conductive Thin Films" Materials 14, no. 5: 1186.

Find Other Styles
Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Article Access Map by Country/Region

Search more from Scilit
Back to TopTop