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Journal: MaterialsVolume: 14Number: 6042
Article: Investigation of Electrical Properties of the Al/SiO2/n++-Si Resistive Switching Structures by Means of Static, Admittance, and Impedance Spectroscopy Measurements
  • Authors:
  • Piotr Wiśniewski1,2,*,
  • Jakub Jasiński3 and
  • Andrzej Mazurak3
  • et al.
Link: https://www.mdpi.com/1996-1944/14/20/6042

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