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Journal: Materials, 2020
Volume: 13
Number: 1583
1583
Article: Exploring the Critical Thickness of Organic Semiconductor Layer for Enhanced Piezoresistive Sensitivity in Field-Effect Transistor Sensors
Authors: by Damien Thuau, Katherine Begley, Rishat Dilmurat, Abduleziz Ablat, Guillaume Wantz, Cédric Ayela and Mamatimin Abbas
Link: https://www.mdpi.com/1996-1944/13/7/1583

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