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Journal: Materials, 2020
Volume: 13
Number: 1291
Article:
Using Digital Image Correlation on SEM Images of Strain Field after Ion Beam Milling for the Residual Stress Measurement of Thin Films
Authors:
by
Terry Yuan-Fang Chen, Yun-Chia Chou, Zhao-Ying Wang, Wen-Yen Lin and Ming-Tzer Lin
Link:
https://www.mdpi.com/1996-1944/13/6/1291
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