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Journal: Materials, 2020
Volume: 13
Number: 5794

Article: An In Situ Reflectance Spectroscopic Investigation to Monitor Two-Dimensional MoS2 Flakes on a Sapphire Substrate
Authors: by Yina Wang, Lei Zhang, Wen Yang, Shanshan Lv, Chenhui Su, Hang Xiao, Faye Zhang, Qingmei Sui, Lei Jia and Mingshun Jiang
Link: https://www.mdpi.com/1996-1944/13/24/5794

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