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Journal: Materials, 2020
Volume: 13
Number: 3595
Article:
Surface Characterization of MoS2 Atomic Layers Mechanically Exfoliated on a Si Substrate
Authors:
by
Mirosław Krawczyk, Marcin Pisarek, Robert Szoszkiewicz and Aleksander Jablonski
Link:
https://www.mdpi.com/1996-1944/13/16/3595
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