Cui, Y.; Dong, P.; Chen, Z.; Li, Z.; Li, L.; Li, J.
Forward Voltage Drop Induced by an Abnormal Threading Dislocation Aggregation in 4H-SiC GTO Devices. Materials 2019, 12, 4042.
https://doi.org/10.3390/ma12244042
AMA Style
Cui Y, Dong P, Chen Z, Li Z, Li L, Li J.
Forward Voltage Drop Induced by an Abnormal Threading Dislocation Aggregation in 4H-SiC GTO Devices. Materials. 2019; 12(24):4042.
https://doi.org/10.3390/ma12244042
Chicago/Turabian Style
Cui, Yingxin, Peng Dong, Zhe Chen, Zhiqiang Li, Lianghui Li, and Juntao Li.
2019. "Forward Voltage Drop Induced by an Abnormal Threading Dislocation Aggregation in 4H-SiC GTO Devices" Materials 12, no. 24: 4042.
https://doi.org/10.3390/ma12244042
APA Style
Cui, Y., Dong, P., Chen, Z., Li, Z., Li, L., & Li, J.
(2019). Forward Voltage Drop Induced by an Abnormal Threading Dislocation Aggregation in 4H-SiC GTO Devices. Materials, 12(24), 4042.
https://doi.org/10.3390/ma12244042