Kim, B.J.; Jeong, B.J.; Oh, S.; Chae, S.; Choi, K.H.; Nasir, T.; Lee, S.H.; Lim, H.K.; Choi, I.J.; Hong, M.-K.;
et al. Thickness-Dependence Electrical Characterization of the One-Dimensional van der Waals TaSe3 Crystal. Materials 2019, 12, 2462.
https://doi.org/10.3390/ma12152462
AMA Style
Kim BJ, Jeong BJ, Oh S, Chae S, Choi KH, Nasir T, Lee SH, Lim HK, Choi IJ, Hong M-K,
et al. Thickness-Dependence Electrical Characterization of the One-Dimensional van der Waals TaSe3 Crystal. Materials. 2019; 12(15):2462.
https://doi.org/10.3390/ma12152462
Chicago/Turabian Style
Kim, Bum Jun, Byung Joo Jeong, Seungbae Oh, Sudong Chae, Kyung Hwan Choi, Tuqeer Nasir, Sang Hoon Lee, Hyung Kyu Lim, Ik Jun Choi, Min-Ki Hong,
and et al. 2019. "Thickness-Dependence Electrical Characterization of the One-Dimensional van der Waals TaSe3 Crystal" Materials 12, no. 15: 2462.
https://doi.org/10.3390/ma12152462
APA Style
Kim, B. J., Jeong, B. J., Oh, S., Chae, S., Choi, K. H., Nasir, T., Lee, S. H., Lim, H. K., Choi, I. J., Hong, M.-K., Yu, H. K., Lee, J.-H., & Choi, J.-Y.
(2019). Thickness-Dependence Electrical Characterization of the One-Dimensional van der Waals TaSe3 Crystal. Materials, 12(15), 2462.
https://doi.org/10.3390/ma12152462