Breakdown Time Phenomena: Analyzing the Conductive Channel of Positive Impulse Voltage Discharges under Standard Temperature and Pressure Air Conditions
Abstract
:1. Introduction
2. Experiments and Methods
3. Results
3.1. Times of Breakdown
3.2. Lines of the Spectrum during Arc Discharges
4. Discussion
4.1. Breakdown Time Influenced by Peak Intensity
4.2. Impact of Excitation Temperature on Breakdown Time
4.3. Electrical Conductivity of the Channel
5. Conclusions
- Shorter breakdown times can be attributed to the channel conductivity with the increased oxygen excitations observed at +60 kV and +75 kV, compared to other applied voltages. These excitations are particularly evident in the 200–400 nm range, especially in the shorter wavelength region of O IV at 262.999 nm and O III at 270.887 nm at +60 kV, as well as O III at 270.887 nm at +75 kV, due to their higher excited states. In contrast, only two spectral lines, in O IV at 262.999 nm and O III at 270.887 nm, contribute to electron flow within the channel at +60 kV and +75 kV with decay times of 2.5 µs and 0.26 µs, respectively. At +48 kV, even though electron density and electrical conductivity are higher than at +60 kV, electrons do not remain in the air for long because they attach to or recombine with neutral atoms and molecules. The shorter breakdown times at +60 kV and +75 kV are achieved through the dominance of oxygen excitations in the 200–400 nm range, with longer decay times allowing electrons to collide with other neutral atoms and molecules. This facilitates the flow of electrons within the channel to bridge the gap.
- The higher excitation temperature of O IV at 262.999 nm maintains electrons in the hot channel to impede the attachment process by releasing Joule heat at 26,003 K for a decay time of 2.5 µs before the recombination process of the O I line at 777.417 nm occurs in 27 ns, thus enhancing channel conductivity compared to other applied voltages. Consequently, the elevated excitation temperature in O IV at 262.999 nm, with sustained electron presences, contributes to the fast breakdown time of 77 ns at +60 kV. Meanwhile, at +75 kV, the additional temperature in O III at 270.887 nm sustains hot conductivity for approximately 0.26 µs resulting in a breakdown time of 102 ns.
- Understanding the electrical conductivity, electron density, and electron energy of O I at 777.417 nm helps to elucidate the breakdown time process. Examining the temperature transitions of oxygen within the 200–400 nm range provides insight into how electrons are prevented from being lost due to the attachment process in the air.
- Increasing the impulse voltage does not guarantee a quick breakdown time. In contrast, at +60 kV, rapid breakdown is achieved due to more intense oxygen excitations, which produce more electrons in higher excited states to maintain the channel through Joule heat. Therefore, O IV at 262.999 nm and O III at 306.498 nm contributed to this effect. The excitation of O IV at 262.999 nm maintains a hot channel at 26,003 K for up to 2.5 µs keeping the electrons energized and enhancing their ability to collide with neutral atoms and molecules thereby preventing the attachment process. Additionally, these oxygen excitations exhibit higher peak intensities in the shorter wavelength range of 200–400 nm than O I at 777.417 nm, which may contribute to the rapid breakdown.
Author Contributions
Funding
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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Applied Voltage | Breakdown Time (t3 – t2) |
---|---|
+42 kV | No breakdown occurs |
+48 kV | (1.280–1.080) µs = 0.2 µs = 200 ns |
+54 kV | (1.292–1.003) µs = 0.289 µs = 289 ns |
+60 kV | (0.968–0.891) µs = 0.077 µs = 77 ns |
+66 kV | (1.019–0.904) µs = 0.115 µs = 115 ns |
+72 kV | (0.891–0.786) µs = 0.105 µs = 105 ns |
+75 kV | (0.850–0.748) µs = 0.102 µs = 102 ns |
Atoms | Wavelength (nm) | Relative Intensity (a.u) at a Voltage of | Excitation Temperature (K) at a Voltage of | Decay Time (s) | |||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
48 kV | 54 kV | 60 kV | 66 kV | 72 kV | 75 kV | 48 kV | 54 kV | 60 kV | 66 kV | 72 kV | 75 kV | ||||
(1) | (2) | (3) | (4) | (5) | (6) | (7) | (8) | (9) | (10) | (11) | (12) | (13) | (14) | (15) | |
O IV | 262.999 | - | - | 3238 | - | - | - | - | - | 26,003 | - | - | - | 2.5 × 10−6 | |
O III | 268.615 | 8828 | 6292 | 6019 | 7479 | 11,816 | 10,804 | 17,829 | 18,030 | 18,057 | 17,927 | 17,659 | 17,711 | 6.3 × 10−9 | |
O III | 270.887 | - | - | - | - | - | 9662 | - | - | - | - | - | 15,212 | 0.26 × 10−6 | |
O III | 286.262 | 14,674 | 12,682 | 14,459 | 15,952 | 25,030 | 21,936 | 16,813 | 16,885 | 16,820 | 16,772 | 16,556 | 16,619 | 0.28 × 10−6 | |
O IV | 300.028 | 4353 | 3824 | 4549 | 5374 | 7645 | 6671 | 22,878 | 22,964 | 22,849 | 22,740 | 22,513 | 22,600 | 0.72 × 10−6 | |
O II | 303.946 | - | 1956 | 2487 | 2846 | 4346 | 3586 | - | - | - | - | - | - | No data | |
O III | 304.293 | 2329 | - | - | - | - | - | 14,142 | - | - | - | - | - | 5.2 × 10−9 | |
O III | 306.498 | - | - | 3085 | - | - | - | - | - | 17,943 | - | - | - | 46 × 10−9 | |
O II | 313.421 | 3595 | 2968 | 3557 | 3519 | 6125 | 5335 | 10,989 | 11,057 | 10,993 | 10,996 | 10,805 | 10,105 | 1.3 × 10−8 | |
O I | 777.417 | 300 | 347 | 40 | 587 | 538 | 607 | 4227 | 4206 | 4209 | 4133 | 4145 | 4128 | 27 × 10−9 |
Parameter | +48 kV | +54 kV | +60 kV | +66 kV | +72 kV | +75 kV |
---|---|---|---|---|---|---|
Electron Density () (cm−3) | 3.656 × 1014 | 2.840 × 1014 | 3.233 × 1014 | 2.945 × 1013 | 2.644 × 1013 | 1.756 × 1013 |
Electron Energy (eV) | 0.364 | 0.363 | 0.363 | 0.356 | 0.357 | 0.356 |
Electrical Conductivity (S/m) | 742 | 730 | 734 | 656 | 656 | 643 |
Breakdown time (ns) | 200 | 289 | 77 | 115 | 105 | 102 |
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Ikhwanus, M.; Morimoto, T. Breakdown Time Phenomena: Analyzing the Conductive Channel of Positive Impulse Voltage Discharges under Standard Temperature and Pressure Air Conditions. Energies 2024, 17, 4222. https://doi.org/10.3390/en17174222
Ikhwanus M, Morimoto T. Breakdown Time Phenomena: Analyzing the Conductive Channel of Positive Impulse Voltage Discharges under Standard Temperature and Pressure Air Conditions. Energies. 2024; 17(17):4222. https://doi.org/10.3390/en17174222
Chicago/Turabian StyleIkhwanus, Muhammad, and Takeshi Morimoto. 2024. "Breakdown Time Phenomena: Analyzing the Conductive Channel of Positive Impulse Voltage Discharges under Standard Temperature and Pressure Air Conditions" Energies 17, no. 17: 4222. https://doi.org/10.3390/en17174222
APA StyleIkhwanus, M., & Morimoto, T. (2024). Breakdown Time Phenomena: Analyzing the Conductive Channel of Positive Impulse Voltage Discharges under Standard Temperature and Pressure Air Conditions. Energies, 17(17), 4222. https://doi.org/10.3390/en17174222