High-Resolution Spatiotemporal-Coded Differential Eddy-Current Array Probe for Defect Detection in Metal Substrates
Abstract
1. Introduction
2. Study of the Detection Mechanism of Eddy-Current Array Probes
2.1. Structure of the M-DECA Probe
2.2. Equivalent Circuit Model of the M-DECA Probe
2.3. Finite Element Analysis of the Probe Model
2.3.1. Eddy Current Detection Principle
2.3.2. Simulation Parameter Setting
2.3.3. Analysis of Simulation Experiment Results
3. Experimental Verification
3.1. Experimental Test System
3.1.1. Excitation and Receiving Circuit of the System
3.1.2. Experimental Set Up
3.2. Experimental Results and Discussion
4. Conclusions
Author Contributions
Funding
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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| Parameters | Size [mm] | Conductivity [S/m] | Relative Permittivity | Parameters | Size [mm] |
|---|---|---|---|---|---|
| Air-shed | 40 × 50 [mm]2 | = 1 [S/m] | 0.3 | ||
| Aluminum substrate | 5 × 50 [mm]2 | = 3.774 × 107 [S/m] | 1.0 | ||
| Coil Unit | coil_id: 0.8 | 5.998 × 107 [S/m] | 1 | 5.0 | |
| coil_od: 2.0 | |||||
| coil_h: 1.0 | |||||
| detect | 0.3 × 1.0 [mm]2 | = 1 [S/m] | 50.0 | ||
| 31.5 | / | / | 1.0 |
| Module | Component | Key Timing Parameter | Typical Value |
|---|---|---|---|
| Excitation source | AD9834 | Wake-up time | 1 ms |
| Voltage-controlled amplifier | VCA810 | 0.1% settling time | 5–8 ns |
| Power amplifier | ADA4870 | 0.1% settling time | 55–82 ns |
| Excitation amplifier | AD829 | 0.1% settling time | 90 ns |
| ADC driver | ADA4932 | 0.1% settling time | 9 ns |
| Multi-channel switch | AD732 | Switching time | 2 ns |
| Single-channel processing period | - | - | 1 ms |
| Full scanning period | - | - | 64 ms |
| Fre | 10 KHz | 30 Khz | 50 KHz | 60 Khz | 80 Khz | 1 Mhz | Optimal Detectable Size | Inversion Error | |
|---|---|---|---|---|---|---|---|---|---|
| Defect | |||||||||
| #1 [d = 2] | Range | \ | \ | [103, 118] | [80, 98] | [68, 106] | \ | 2.127 | 6.35% |
| Diameter | 2.127 | 2.322 | 4.294 | ||||||
| #2 [d = 4] | Range | [61, 75] | [150, 182] | [239, 268] | [222, 257] | [238, 284] | \ | 3.8286 | 4.29% |
| Diameter | 6.286 | 6.176 | 3.8286 | 4.257 | 5.198 | ||||
| #3 [d = 6] | Range | [103, 121] | [244, 293] | [375, 419] | [366, 420] | [399, 472] | \ | 6.2392 | 3.98% |
| Diameter | 8.082 | 9.457 | 6.2392 | 6.966 | 8.249 | ||||
| #4 [d = 10] | Range | [144, 168] | [342, 404] | [498, 571] | [510, 583] | [568, 660] | \ | 10.3514 | 3.50% |
| Diameter | 10.776 | 11.966 | 10.3514 | 9.417 | 10.396 | ||||
| #5 [d = 14] | Range | [187, 213] | [439, 509] | [626, 719] | [658, 744] | [731, 838] | \ | 13.1874 | 5.80% |
| Diameter | 11.674 | 13.51 | 13.1874 | 11.094 | 12.091 |
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© 2026 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license.
Share and Cite
Ouyang, Q.; Meng, Y.; Huang, L.; Li, Y. High-Resolution Spatiotemporal-Coded Differential Eddy-Current Array Probe for Defect Detection in Metal Substrates. Sensors 2026, 26, 537. https://doi.org/10.3390/s26020537
Ouyang Q, Meng Y, Huang L, Li Y. High-Resolution Spatiotemporal-Coded Differential Eddy-Current Array Probe for Defect Detection in Metal Substrates. Sensors. 2026; 26(2):537. https://doi.org/10.3390/s26020537
Chicago/Turabian StyleOuyang, Qi, Yuke Meng, Lun Huang, and Yun Li. 2026. "High-Resolution Spatiotemporal-Coded Differential Eddy-Current Array Probe for Defect Detection in Metal Substrates" Sensors 26, no. 2: 537. https://doi.org/10.3390/s26020537
APA StyleOuyang, Q., Meng, Y., Huang, L., & Li, Y. (2026). High-Resolution Spatiotemporal-Coded Differential Eddy-Current Array Probe for Defect Detection in Metal Substrates. Sensors, 26(2), 537. https://doi.org/10.3390/s26020537

