Author Contributions
Conceptualization, L.T., M.C. and G.C.; methodology, L.T., M.C. and G.C.; software, L.T., M.C. and G.C.; validation, L.T., M.C., G.C. and F.S.; formal analysis, L.T., M.C., G.C., F.S. and P.K.; investigation, L.T., M.C., G.C., S.S., F.S., G.F., L.F., P.K. and A.M.; resources, G.F., L.F., P.K. and A.M.; data curation, L.T., M.C., G.C. and S.S.; writing—original draft preparation, L.T., M.C., G.C., S.S., F.S., G.F., L.F., P.K. and A.M.; writing—review and editing, L.T., M.C., L.F., P.K. and A.M.; supervision, L.T., L.F. and A.M.; project administration, L.F. and A.M.; funding acquisition, L.F. and A.M. All authors have read and agreed to the published version of the manuscript. The authors L.T. and M.C. contribute equally.
Figure 1.
SEM images of two graphitic films after annealing: (a) 10 nm Ni layer, FS substrate; (b) 30 nm Ni layer, FS substrate.
Figure 1.
SEM images of two graphitic films after annealing: (a) 10 nm Ni layer, FS substrate; (b) 30 nm Ni layer, FS substrate.
Figure 2.
Raman spectra of the graphitic film for 3 nm, 10 nm, and 30 nm Ni layer on Si/Si3N4, Si/SiO2, and FS substrates.
Figure 2.
Raman spectra of the graphitic film for 3 nm, 10 nm, and 30 nm Ni layer on Si/Si3N4, Si/SiO2, and FS substrates.
Figure 3.
The EIS measures the electrical impedance of the nanomembrane, shown on the left, according to the circuit model shown ( represents the nanomembrane impedance).
Figure 3.
The EIS measures the electrical impedance of the nanomembrane, shown on the left, according to the circuit model shown ( represents the nanomembrane impedance).
Figure 4.
(a) shows the sensor placed inside the climatic chamber connected to the impedance meter during the characterisation phase. (b) shows in detail the PCB support used for interfacing with the nanomembrane.
Figure 4.
(a) shows the sensor placed inside the climatic chamber connected to the impedance meter during the characterisation phase. (b) shows in detail the PCB support used for interfacing with the nanomembrane.
Figure 5.
Measurement setup used for characterising nanomembranes. It consists of a sensor embedded in the PCB support, an impedance meter and a PC to manage operations via RS232 communication.
Figure 5.
Measurement setup used for characterising nanomembranes. It consists of a sensor embedded in the PCB support, an impedance meter and a PC to manage operations via RS232 communication.
Figure 6.
Characterisation at varying temperatures and fixed humidity showing (a) the modulus and (b) the phase of the nanomembrane’s impedance.
Figure 6.
Characterisation at varying temperatures and fixed humidity showing (a) the modulus and (b) the phase of the nanomembrane’s impedance.
Figure 7.
Characterisation at varying humidity and fixed temperature showing (a) the modulus and (b) the phase of the nanomembrane’s impedance.
Figure 7.
Characterisation at varying humidity and fixed temperature showing (a) the modulus and (b) the phase of the nanomembrane’s impedance.
Figure 8.
Measurement circuit used to implement the impedance spectroscopy: “” represents the sample impedance, whereas “” represents the unknown impedance to be measured.
Figure 8.
Measurement circuit used to implement the impedance spectroscopy: “” represents the sample impedance, whereas “” represents the unknown impedance to be measured.
Figure 9.
Setup realised for the experimental measurement campaign.
Figure 9.
Setup realised for the experimental measurement campaign.
Figure 10.
Trend of the experimental errors on the impedance modulus (a) and phase (b) compared to the reference instrument for all tested forcing voltages at a test impedance value of 200 .
Figure 10.
Trend of the experimental errors on the impedance modulus (a) and phase (b) compared to the reference instrument for all tested forcing voltages at a test impedance value of 200 .
Figure 11.
Flowchart used during the monitoring campaign and analysis of the results obtained. It illustrates the three operational steps carried out: configuration, monitoring and analysis.
Figure 11.
Flowchart used during the monitoring campaign and analysis of the results obtained. It illustrates the three operational steps carried out: configuration, monitoring and analysis.
Figure 12.
Response curves of the modulus of impedance offered by the nanomembranes at different test conditions (pollutant concentration levels). At the 5′ min, the drop (H2O + pollutant) on the nanomembrane occurs.
Figure 12.
Response curves of the modulus of impedance offered by the nanomembranes at different test conditions (pollutant concentration levels). At the 5′ min, the drop (H2O + pollutant) on the nanomembrane occurs.
Figure 13.
Response curves of the percent variations in impedance modulus, compared to the baseline, offered by the nanomembranes under different test conditions (pollutant concentration levels). At the 5′ min, the drop (H2O + pollutant) on the nanomembrane occurs.
Figure 13.
Response curves of the percent variations in impedance modulus, compared to the baseline, offered by the nanomembranes under different test conditions (pollutant concentration levels). At the 5′ min, the drop (H2O + pollutant) on the nanomembrane occurs.
Figure 14.
Experimental setup used for the comparison. It shows the commercial system used PalmSens4 (PalmSens, Houten, The Netherlands).
Figure 14.
Experimental setup used for the comparison. It shows the commercial system used PalmSens4 (PalmSens, Houten, The Netherlands).
Figure 15.
Frequency response relative to the impedance modulus offered by the commercial system used, at 180 s after the pollutant drop, for each concentration tested (solid lines—left axis). Show the comparison with the trend obtained, in terms of change in impedance modulus, at the same instant, with the method proposed in the work (dashed lines—right axis).
Figure 15.
Frequency response relative to the impedance modulus offered by the commercial system used, at 180 s after the pollutant drop, for each concentration tested (solid lines—left axis). Show the comparison with the trend obtained, in terms of change in impedance modulus, at the same instant, with the method proposed in the work (dashed lines—right axis).
Table 1.
Operating measurement specifications for the setup implemented. It shows the range and number of frequencies of the sinusoidal signals generated by the Tiepie HS5 for the EIS; while for acquisition using the TiePie HS6, it shows the sampling frequency, observation time and channel configuration in terms of full scale, number of bits and mode.
Table 1.
Operating measurement specifications for the setup implemented. It shows the range and number of frequencies of the sinusoidal signals generated by the Tiepie HS5 for the EIS; while for acquisition using the TiePie HS6, it shows the sampling frequency, observation time and channel configuration in terms of full scale, number of bits and mode.
| Parameter | Value |
|---|
| Input signal Frequency range | 20 Hz ÷ 1 MHz |
| Number of frequencies generated | 15 (logaritdmic step) |
| Sampling Frequency | 50 × Frequency Input |
| Observation Time | Signal Period × 5 |
| Voltage Full Scale | Auto-scale |
| ADC Resolution | 14 bits |
| Channel modes | Differential |
Table 2.
Measurement performance in estimating the modulus of the impedance: average () and maximum () errors at all the considered test voltages () and impedance values.
Table 2.
Measurement performance in estimating the modulus of the impedance: average () and maximum () errors at all the considered test voltages () and impedance values.
| V | V | V | V |
|---|
| | | | | | | |
|---|
| [%] |
| 50 | −0.015 | 0.85 | 0.21 | 1.2 | 0.039 | 1.3 | 0.017 | 1.2 |
| 100 | 0.080 | 1.3 | 0.24 | 1.7 | 0.081 | 1.8 | 0.092 | 1.7 |
| 200 | 0.60 | 1.5 | 0.81 | 1.8 | 0.75 | 2.0 | 0.78 | 2.1 |
| 500 | 1.5 | 3.5 | 1.5 | 3.7 | 1.9 | 4.1 | 1.9 | 4.2 |
Table 3.
Measurement performance in estimating the phase of the impedance: average () and maximum () errors at all the considered test voltages () and impedance values.
Table 3.
Measurement performance in estimating the phase of the impedance: average () and maximum () errors at all the considered test voltages () and impedance values.
| V | V | V | V |
|---|
| | | | | | | |
|---|
| [deg] |
| 50 | −0.29 | 5.5 | −0.29 | 4.9 | −0.31 | 5.0 | −0.32 | 5.1 |
| 100 | 0.31 | 6.6 | 0.35 | 6.1 | 0.33 | 6.2 | 0.34 | 6.3 |
| 200 | −0.38 | 6.7 | −0.36 | 6.2 | −0.40 | 6.3 | −0.41 | 6.3 |
| 500 | 1.6 | 11 | 1.5 | 11 | 1.5 | 11 | 1.5 | 11 |
Table 4.
Identifier (M#) of the nanomembranes used for each tested pollutant concentration.
Table 4.
Identifier (M#) of the nanomembranes used for each tested pollutant concentration.
| Index | Pollutant Concentration |
|---|
| 0 mM |
0.1 mM
|
1 mM
|
10 mM
|
|---|
| M# | 1, 2, 3, 4 | 5, 6, 7, 8 | 9, 10, 11, 12 | 13, 14, 15, 16 |
Table 5.
Response obtained from the system regarding the amplitude of the minimum analysed frequency (20 Hz) and the amplitude value of the spread . It shows the mean and standard deviation values, in percent [%], at specific time instants after the drop. A colour scale has been added to facilitate reading.
Table 5.
Response obtained from the system regarding the amplitude of the minimum analysed frequency (20 Hz) and the amplitude value of the spread . It shows the mean and standard deviation values, in percent [%], at specific time instants after the drop. A colour scale has been added to facilitate reading.
| Test | Time [s] | Value at 20 Hz [%] | Spread [%] |
|---|
|
Average
|
DevSth
|
Average
|
DevSth
|
|---|
| 0 mM | 30 | 0.36 | 0.10 | 2.98 | 0.28 |
| 60 | 0.78 | 0.36 | 2.72 | 0.54 |
| 90 | 0.95 | 0.38 | 2.75 | 0.63 |
| 120 | 1.03 | 0.39 | 2.71 | 0.53 |
| 150 | 1.16 | 0.26 | 2.78 | 0.64 |
| 180 | 1.20 | 0.28 | 2.74 | 0.63 |
| 0.1 mM | 30 | −0.06 | 0.19 | 1.76 | 0.36 |
| 60 | −0.12 | 0.22 | 2.72 | 0.82 |
| 90 | −0.15 | 0.15 | 3.0 | 1.20 |
| 120 | −0.19 | 0.17 | 3.0 | 1.20 |
| 150 | −0.20 | 0.17 | 2.9 | 1.10 |
| 180 | −0.21 | 0.17 | 2.9 | 1.20 |
| 1 mM | 30 | −0.62 | 0.67 | 2.13 | 0.36 |
| 60 | −0.67 | 0.70 | 2.47 | 0.42 |
| 90 | −0.98 | 0.81 | 2.56 | 0.39 |
| 120 | −1.06 | 0.82 | 2.60 | 0.40 |
| 150 | −1.12 | 0.82 | 2.60 | 0.40 |
| 180 | −1.22 | 0.89 | 2.64 | 0.38 |
| 10 mM | 30 | −2.6 | 2.7 | 8.9 | 5.6 |
| 60 | −2.8 | 2.8 | 12.1 | 2.5 |
| 90 | −2.9 | 2.8 | 12.6 | 2.7 |
| 120 | −3.0 | 2.8 | 12.6 | 2.5 |
| 150 | −3.0 | 2.8 | 12.3 | 2.5 |
| 180 | −3.1 | 2.8 | 12.3 | 2.4 |
Table 6.
Response at minimum analysed frequency (20 Hz) and spread , both in terms of impedance module, obtained from the commercial system. It shows for both the mean and standard deviation values at specific time instants after the drop. A colour scale has been added to facilitate reading.
Table 6.
Response at minimum analysed frequency (20 Hz) and spread , both in terms of impedance module, obtained from the commercial system. It shows for both the mean and standard deviation values at specific time instants after the drop. A colour scale has been added to facilitate reading.
| Test | Time [s] | Value at 20 Hz [kΩ] | Spread [kΩ] |
|---|
|
Average
|
DevSth
|
Average
|
DevSth
|
|---|
| 0 mM | 60 | 132.92 | 10.81 | 132.25 | 7.68 |
| 120 | 118.70 | 14.23 | 118.07 | 10.07 |
| 180 | 107.95 | 13.62 | 108.73 | 9.83 |
| 0.1 mM | 60 | 137.04 | 4.45 | 136.26 | 3.15 |
| 120 | 126.40 | 4.62 | 125.73 | 3.26 |
| 180 | 120.08 | 7.08 | 119.3 | 5.00 |
| 1 mM | 60 | 64.49 | 2.84 | 63.70 | 2.02 |
| 120 | 61.01 | 2.65 | 60.24 | 1.86 |
| 180 | 58.94 | 3.04 | 58.26 | 2.10 |
| 10 mM | 60 | 19.2 | 1.20 | 18.5 | 0.90 |
| 120 | 18.9 | 1.40 | 18.3 | 1.00 |
| 180 | 18.7 | 1.50 | 18.1 | 1.10 |