Order Article Reprints

dos Santos TTS, Marques AP, Monteiro LCP, Santos EGdR, Pinto GHL, Belgamo A, Costa e Silva AdA, Cabral AdS, Kuliś S, Gajewski J, et al. Intra and Inter-Device Reliabilities of the Instrumented Timed-Up and Go Test Using Smartphones in Young Adult Population. Sensors. 2024; 24(9):2918. https://doi.org/10.3390/s24092918

dos Santos, Thâmela Thaís Santos, Amélia Pasqual Marques, Luis Carlos Pereira Monteiro, Enzo Gabriel da Rocha Santos, Gustavo Henrique Lima Pinto, Anderson Belgamo, Anselmo de Athayde Costa e Silva, André dos Santos Cabral, Szymon Kuliś, Jan Gajewski, and et al. 2024. "Intra and Inter-Device Reliabilities of the Instrumented Timed-Up and Go Test Using Smartphones in Young Adult Population" Sensors 24, no. 9: 2918. https://doi.org/10.3390/s24092918

dos Santos, T. T. S., Marques, A. P., Monteiro, L. C. P., Santos, E. G. d. R., Pinto, G. H. L., Belgamo, A., Costa e Silva, A. d. A., Cabral, A. d. S., Kuliś, S., Gajewski, J., Souza, G. S., Silva, T. J. d., Costa, W. T. A. d., Salomão, R. C., & Callegari, B. (2024). Intra and Inter-Device Reliabilities of the Instrumented Timed-Up and Go Test Using Smartphones in Young Adult Population. Sensors, 24(9), 2918. https://doi.org/10.3390/s24092918