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Journal: Sensors, 2023
Volume: 23
Number: 1889

Article: Generative Adversarial Network-Based Fault Detection in Semiconductor Equipment with Class-Imbalanced Data
Authors: by Jeong Eun Choi, Da Hoon Seol, Chan Young Kim and Sang Jeen Hong
Link: https://www.mdpi.com/1424-8220/23/4/1889

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