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Journal: Sensors, 2023
Volume: 23
Number: 9150
9150
Article:
Automotive 2.1 μm Full-Depth Deep Trench Isolation CMOS Image Sensor with a 120 dB Single-Exposure Dynamic Range
Authors:
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Dongsuk Yoo, Youngtae Jang, Youngchan Kim, Jihun Shin, Kangsun Lee, Seok-Yong Park, Seungho Shin, Hongsuk Lee, Seojoo Kim, Joongseok Park, Cheonho Park, Moosup Lim, Hyungjin Bae, Soeun Park, Minwook Jung, Sungkwan Kim, Shinyeol Choi, Sejun Kim, Jinkyeong Heo, Hojoon Lee, KyungChoon Lee, Youngkyun Jeong, Youngsun Oh, Min-Sun Keel, Bumsuk Kim, Haechang Lee and JungChak Ahnadd
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Cite
Yoo, D.; Jang, Y.; Kim, Y.; Shin, J.; Lee, K.; Park, S.-Y.; Shin, S.; Lee, H.; Kim, S.; Park, J.; et al. Automotive 2.1 μm Full-Depth Deep Trench Isolation CMOS Image Sensor with a 120 dB Single-Exposure Dynamic Range. Sensors 2023, 23, 9150. https://doi.org/10.3390/s23229150
Yoo D, Jang Y, Kim Y, Shin J, Lee K, Park S-Y, Shin S, Lee H, Kim S, Park J, et al. Automotive 2.1 μm Full-Depth Deep Trench Isolation CMOS Image Sensor with a 120 dB Single-Exposure Dynamic Range. Sensors. 2023; 23(22):9150. https://doi.org/10.3390/s23229150
Chicago/Turabian StyleYoo, Dongsuk, Youngtae Jang, Youngchan Kim, Jihun Shin, Kangsun Lee, Seok-Yong Park, Seungho Shin, Hongsuk Lee, Seojoo Kim, Joongseok Park, and et al. 2023. "Automotive 2.1 μm Full-Depth Deep Trench Isolation CMOS Image Sensor with a 120 dB Single-Exposure Dynamic Range" Sensors 23, no. 22: 9150. https://doi.org/10.3390/s23229150
APA StyleYoo, D., Jang, Y., Kim, Y., Shin, J., Lee, K., Park, S.-Y., Shin, S., Lee, H., Kim, S., Park, J., Park, C., Lim, M., Bae, H., Park, S., Jung, M., Kim, S., Choi, S., Kim, S., Heo, J., ... Ahn, J. (2023). Automotive 2.1 μm Full-Depth Deep Trench Isolation CMOS Image Sensor with a 120 dB Single-Exposure Dynamic Range. Sensors, 23(22), 9150. https://doi.org/10.3390/s23229150
