Verbiest, J.R.; Bonnechère, B.; Saeys, W.; Van de Walle, P.; Truijen, S.; Meyns, P.
Gait Stride Length Estimation Using Embedded Machine Learning. Sensors 2023, 23, 7166.
https://doi.org/10.3390/s23167166
AMA Style
Verbiest JR, Bonnechère B, Saeys W, Van de Walle P, Truijen S, Meyns P.
Gait Stride Length Estimation Using Embedded Machine Learning. Sensors. 2023; 23(16):7166.
https://doi.org/10.3390/s23167166
Chicago/Turabian Style
Verbiest, Joeri R., Bruno Bonnechère, Wim Saeys, Patricia Van de Walle, Steven Truijen, and Pieter Meyns.
2023. "Gait Stride Length Estimation Using Embedded Machine Learning" Sensors 23, no. 16: 7166.
https://doi.org/10.3390/s23167166
APA Style
Verbiest, J. R., Bonnechère, B., Saeys, W., Van de Walle, P., Truijen, S., & Meyns, P.
(2023). Gait Stride Length Estimation Using Embedded Machine Learning. Sensors, 23(16), 7166.
https://doi.org/10.3390/s23167166