Dueñas, J.A.; Cobo, A.; López, L.; Galtarossa, F.; Goasduff, A.; Mengoni, D.; Sánchez-BenÃtez, A.M.
Test Bench for Highly Segmented GRIT Double-Sided Silicon Strip Detectors: A Detector Quality Control Protocol. Sensors 2023, 23, 5384.
https://doi.org/10.3390/s23125384
AMA Style
Dueñas JA, Cobo A, López L, Galtarossa F, Goasduff A, Mengoni D, Sánchez-BenÃtez AM.
Test Bench for Highly Segmented GRIT Double-Sided Silicon Strip Detectors: A Detector Quality Control Protocol. Sensors. 2023; 23(12):5384.
https://doi.org/10.3390/s23125384
Chicago/Turabian Style
Dueñas, J. A., A. Cobo, L. López, F. Galtarossa, A. Goasduff, D. Mengoni, and A. M. Sánchez-BenÃtez.
2023. "Test Bench for Highly Segmented GRIT Double-Sided Silicon Strip Detectors: A Detector Quality Control Protocol" Sensors 23, no. 12: 5384.
https://doi.org/10.3390/s23125384
APA Style
Dueñas, J. A., Cobo, A., López, L., Galtarossa, F., Goasduff, A., Mengoni, D., & Sánchez-BenÃtez, A. M.
(2023). Test Bench for Highly Segmented GRIT Double-Sided Silicon Strip Detectors: A Detector Quality Control Protocol. Sensors, 23(12), 5384.
https://doi.org/10.3390/s23125384