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Journal: Sensors, 2022
Volume: 22
Number: 4158
Article:
Application of Three-Repetition Tests Scheme to Improve Integrated Circuits Test Quality to Near-Zero Defect
Authors:
by
Chung-Huang Yeh and Jwu-E Chen
Link:
https://www.mdpi.com/1424-8220/22/11/4158
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