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Arezki Y, Su R, Heikkinen V, Leprete F, Posta P, Bitou Y, Schober C, Mehdi-Souzani C, Alzahrani BAM, Zhang X, et al. Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level. Sensors. 2021; 21(4):1103. https://doi.org/10.3390/s21041103

Arezki, Yassir, Rong Su, Ville Heikkinen, François Leprete, Pavel Posta, Youichi Bitou, Christian Schober, Charyar Mehdi-Souzani, Bandar Abdulrahman Mohammed Alzahrani, Xiangchao Zhang, and et al. 2021. "Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level" Sensors 21, no. 4: 1103. https://doi.org/10.3390/s21041103

Arezki, Y., Su, R., Heikkinen, V., Leprete, F., Posta, P., Bitou, Y., Schober, C., Mehdi-Souzani, C., Alzahrani, B. A. M., Zhang, X., Kondo, Y., Pruss, C., Ledl, V., Anwer, N., Bouazizi, M. L., Leach, R., & Nouira, H. (2021). Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level. Sensors, 21(4), 1103. https://doi.org/10.3390/s21041103