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Journal: SensorsVolume: 21Number: 8271
Article: OBET: On-the-Fly Byte-Level Error Tracking for Correcting and Detecting Faults in Unreliable DRAM Systems
- Authors:
- Duy-Thanh Nguyen1,
- Nhut-Minh Ho2 and
- Weng-Fai Wong2
- et al.
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