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Journal: Sensors, 2021
Volume: 21
Number: 8271

Article: OBET: On-the-Fly Byte-Level Error Tracking for Correcting and Detecting Faults in Unreliable DRAM Systems
Authors: by Duy-Thanh Nguyen, Nhut-Minh Ho, Weng-Fai Wong and Ik-Joon Chang
Link: https://www.mdpi.com/1424-8220/21/24/8271

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