Order Article Reprints

Li Y, Zha G, Wei D, Yang F, Dong J, Xi S, Xu L, Jie W. Effect of Deep-Level Defects on the Performance of CdZnTe Photon Counting Detectors. Sensors. 2020; 20(7):2032. https://doi.org/10.3390/s20072032

Li, Yingrui, Gangqiang Zha, Dengke Wei, Fan Yang, Jiangpeng Dong, Shouzhi Xi, Lingyan Xu, and Wanqi Jie. 2020. "Effect of Deep-Level Defects on the Performance of CdZnTe Photon Counting Detectors" Sensors 20, no. 7: 2032. https://doi.org/10.3390/s20072032

Li, Y., Zha, G., Wei, D., Yang, F., Dong, J., Xi, S., Xu, L., & Jie, W. (2020). Effect of Deep-Level Defects on the Performance of CdZnTe Photon Counting Detectors. Sensors, 20(7), 2032. https://doi.org/10.3390/s20072032