Setiono, A.; Bertke, M.; Nyang’au, W.O.; Xu, J.; Fahrbach, M.; Kirsch, I.; Uhde, E.; Deutschinger, A.; Fantner, E.J.; Schwalb, C.H.;
et al. In-Plane and Out-of-Plane MEMS Piezoresistive Cantilever Sensors for Nanoparticle Mass Detection. Sensors 2020, 20, 618.
https://doi.org/10.3390/s20030618
AMA Style
Setiono A, Bertke M, Nyang’au WO, Xu J, Fahrbach M, Kirsch I, Uhde E, Deutschinger A, Fantner EJ, Schwalb CH,
et al. In-Plane and Out-of-Plane MEMS Piezoresistive Cantilever Sensors for Nanoparticle Mass Detection. Sensors. 2020; 20(3):618.
https://doi.org/10.3390/s20030618
Chicago/Turabian Style
Setiono, Andi, Maik Bertke, Wilson Ombati Nyang’au, Jiushuai Xu, Michael Fahrbach, Ina Kirsch, Erik Uhde, Alexander Deutschinger, Ernest J. Fantner, Christian H. Schwalb,
and et al. 2020. "In-Plane and Out-of-Plane MEMS Piezoresistive Cantilever Sensors for Nanoparticle Mass Detection" Sensors 20, no. 3: 618.
https://doi.org/10.3390/s20030618
APA Style
Setiono, A., Bertke, M., Nyang’au, W. O., Xu, J., Fahrbach, M., Kirsch, I., Uhde, E., Deutschinger, A., Fantner, E. J., Schwalb, C. H., Wasisto, H. S., & Peiner, E.
(2020). In-Plane and Out-of-Plane MEMS Piezoresistive Cantilever Sensors for Nanoparticle Mass Detection. Sensors, 20(3), 618.
https://doi.org/10.3390/s20030618