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Journal: Sensors, 2020
Volume: 20
Number: 4759

Article: Improved Defect Detection of Guided Wave Testing Using Split-Spectrum Processing
Authors: by Seyed Kamran Pedram, Tat-Hean Gan and Mahdieh Ghafourian
Link: https://www.mdpi.com/1424-8220/20/17/4759

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