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Open AccessArticle

Bit Error Rate Closed-Form Expressions for LoRa Systems under Nakagami and Rice Fading Channels

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Department of Digital Hardware Design, Instituto Eldorado, Eldorado, Alan Turing - 275, Campinas 13083-898, Brazil
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Department of Communications, University of Campinas, Albert Einstein - 400, Campinas 13083-852, Brazil
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Author to whom correspondence should be addressed.
Sensors 2019, 19(20), 4412; https://doi.org/10.3390/s19204412
Received: 8 August 2019 / Revised: 24 September 2019 / Accepted: 26 September 2019 / Published: 12 October 2019
(This article belongs to the Special Issue Low-Power Sensors and Systems for IoT)
We derive exact closed-form expressions for Long Range (LoRa) bit error probability and diversity order for channels subject to Nakagami-m, Rayleigh and Rician fading. Analytical expressions are compared with numerical results, showing the accuracy of our proposed exact expressions. In the limiting case of the Nakagami and Rice parameters, our bit error probability expressions specialize into the non-fading case. View Full-Text
Keywords: LPWAN; Internet of Things; MIMO; Nakagami; Rayleigh; Rice LPWAN; Internet of Things; MIMO; Nakagami; Rayleigh; Rice
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Ferreira Dias, C.; Rodrigues de Lima, E.; Fraidenraich, G. Bit Error Rate Closed-Form Expressions for LoRa Systems under Nakagami and Rice Fading Channels. Sensors 2019, 19, 4412.

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