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Journal: Sensors, 2016
Volume: 16
Number: 1553

Article: Digital Platform for Wafer-Level MEMS Testing and Characterization Using Electrical Response
Authors: by Nuno Brito, Carlos Ferreira, Filipe Alves, Jorge Cabral, João Gaspar, João Monteiro and Luís Rocha
Link: https://www.mdpi.com/1424-8220/16/9/1553

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