Digital Platform for Wafer-Level MEMS Testing and Characterization Using Electrical Response
Brito, N.; Ferreira, C.; Alves, F.; Cabral, J.; Gaspar, J.; Monteiro, J.; Rocha, L. Digital Platform for Wafer-Level MEMS Testing and Characterization Using Electrical Response. Sensors 2016, 16, 1553. https://doi.org/10.3390/s16091553
Brito N, Ferreira C, Alves F, Cabral J, Gaspar J, Monteiro J, Rocha L. Digital Platform for Wafer-Level MEMS Testing and Characterization Using Electrical Response. Sensors. 2016; 16(9):1553. https://doi.org/10.3390/s16091553
Chicago/Turabian StyleBrito, Nuno, Carlos Ferreira, Filipe Alves, Jorge Cabral, João Gaspar, João Monteiro, and Luís Rocha. 2016. "Digital Platform for Wafer-Level MEMS Testing and Characterization Using Electrical Response" Sensors 16, no. 9: 1553. https://doi.org/10.3390/s16091553