High-Resolution Cryo-Electron Microscopy Structure Determination of Haemophilus influenzae Tellurite-Resistance Protein A via 200 kV Transmission Electron Microscopy
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Tran, N.L.; Senko, S.; Lucier, K.W.; Farwell, A.C.; Silva, S.M.; Dip, P.V.; Poweleit, N.; Scapin, G.; Catalano, C. High-Resolution Cryo-Electron Microscopy Structure Determination of Haemophilus influenzae Tellurite-Resistance Protein A via 200 kV Transmission Electron Microscopy. Int. J. Mol. Sci. 2024, 25, 4528. https://doi.org/10.3390/ijms25084528
Tran NL, Senko S, Lucier KW, Farwell AC, Silva SM, Dip PV, Poweleit N, Scapin G, Catalano C. High-Resolution Cryo-Electron Microscopy Structure Determination of Haemophilus influenzae Tellurite-Resistance Protein A via 200 kV Transmission Electron Microscopy. International Journal of Molecular Sciences. 2024; 25(8):4528. https://doi.org/10.3390/ijms25084528
Chicago/Turabian StyleTran, Nhi L., Skerdi Senko, Kyle W. Lucier, Ashlyn C. Farwell, Sabrina M. Silva, Phat V. Dip, Nicole Poweleit, Giovanna Scapin, and Claudio Catalano. 2024. "High-Resolution Cryo-Electron Microscopy Structure Determination of Haemophilus influenzae Tellurite-Resistance Protein A via 200 kV Transmission Electron Microscopy" International Journal of Molecular Sciences 25, no. 8: 4528. https://doi.org/10.3390/ijms25084528
APA StyleTran, N. L., Senko, S., Lucier, K. W., Farwell, A. C., Silva, S. M., Dip, P. V., Poweleit, N., Scapin, G., & Catalano, C. (2024). High-Resolution Cryo-Electron Microscopy Structure Determination of Haemophilus influenzae Tellurite-Resistance Protein A via 200 kV Transmission Electron Microscopy. International Journal of Molecular Sciences, 25(8), 4528. https://doi.org/10.3390/ijms25084528

