Surface Analysis of Materials With Charged-Particle Beams
A special issue of Quantum Beam Science (ISSN 2412-382X).
Deadline for manuscript submissions: closed (31 December 2019) | Viewed by 8007
Special Issue Editors
Interests: material analysis using quantum beams
Interests: interactions of energetic ions with solids; energy-loss processes of molecular/cluster ions in solids; secondary-electron emissions; sputtering; secondary-ion emissions; radiation damages; ion-beam analyses of materials; ion-beam modification of materials
Special Issue Information
Dear Colleagues,
Surface analysis using charged-particle beams has been playing an important role in various research fields, especially materials science and bioscience. Information on atomic composition and structure, defects, chemical structure, etc. can be obtained with the measurement of energy and/or yield of particles and radiation that emerge from a material irradiated with charged particles, i.e., ions, electrons, positrons, muons, etc. Its importance is still increasing, so that relevant techniques are also being developed from the viewpoint of higher resolution, higher sensitivity, advanced measurement, etc.; for example, in-air analysis using charged-particle beams, which has been developed recently, enables us to characterize biomaterials under wet conditions. In addition, novel beams, such as muon and cluster-ion beams, are increasingly applied to high-sensitivity and high-resolution surface analysis.
Reviews or articles on surface analysis with newly developed methods, modified techniques using charged-particle beams or their applications are the focus of this Special Issue. The issue will include subject matter concerning, but not limited to, the following keywords:
- High-resolution depth profiling
- High-sensitivity measurement
- In-air analysis
- Elemental-distribution imaging
- RBS
- ERDA
- SIMS
- PIXE
- NRA
- Applications using materials science, surface physics, surface chemistry, bioscience, drug discovery, geophysics, astrophysics, etc.
Dr. Kouichi Hirata
Dr. Kazumasa Narumi
Guest Editors
Manuscript Submission Information
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Keywords
- Ion beams
- Electron/positron beams
- Muon beams
- High-resolution/sensitivity measurement
- In-air analysis
- Elemental-distribution imaging
- Materials science
- Surface physics and chemistry
- Bioscience
- Geophysics and/or astrophysics
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