Special Issue "Are the Today’s Practices for Reliability Assurance of Aerospace Electronic and Photonic Products (AEPP) Adequate?"

A special issue of Aerospace (ISSN 2226-4310).

Deadline for manuscript submissions: closed (31 October 2015) | Viewed by 155

Special Issue Editor

Prof. Dr. Ephraim Suhir
E-Mail Website
Guest Editor
1. Physical Sciences and Engineering Research Division, Bell Laboratories, Murray Hill, NJ 07974-0636, USA (retired)
2. Departments of Mechanical and Material, and Electrical and Computer Engineering, Portland State University, Portland, OR 97201, USA
3. Department of Applied Electronic Materials, Institute of Sensors and Actuators, Technical University, 1190 Vienna, Austria
4. Mackay Institute of Research and Innovation, James Cook University, Townsville, QLD 4811, Australia
Interests: applied mathematics, applied mechanics, probabilistic methods in reliability engineering, technical diagnostics; composite and smart materials and systems; shock and vibrations analyses and testing; thermal stress analysis; human-in-the-loop; aerospace missions success and safety
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Special Issue Information

Dear Colleagues,

Despite all efforts to date, the current aerospace electronic and photonic products (AEPP) that have undergone highly accelerated life testing (HALT), passed qualification tests (QT) and survived burn-in testing (BIT), often still fail in the field. Are the existing reliability assurance practices for AEPP adequate? If not, what could be done differently so that the failure-free performance of a product is assured in the field? Could methods of probabilistic risk analyses be effectively used to offer a reliability rate? On the other hand, the highly popular and widely used HALT, if successful, is supposed to create significant (although unspecified) safety margins. Could these parameters result in an over-engineered product whose cost is considerably higher? Could a well substantiated reduction in the superfluously high reliability of an over-engineered product, or some of its parts, be translated into a lower cost and shorter time-to-market? The reliability cannot be too low, nor does it have to be higher than necessary, but should be adequate for a particular application. To address these questions, one has to be able to quantify reliability. This is particularly important in AEPPs, where high reliability is imperative; the performance of many vital non-electronic-and-photonic products and systems is strongly dependent on the reliability of their electronic and photonic materials. Furthermore, the roles of accelerated testing, design-for-reliability efforts, and the prognostics and health monitoring activity must be considered. All these critical questions will be addressed in this Special Issue of our journal, Aerospace. Therefore, we look forward to hearing of your suggestions for a paper via the submission system at susy.mdpi.com or an email to [email protected].

Prof. Dr. Ephraim Suhir
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Aerospace is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.


  • electronic products
  • photonic products
  • aepp
  • highly accelerated life testing (halt)
  • passed qualification tests (qt)
  • survived burn-in testing (bit)

Published Papers

There is no accepted submissions to this special issue at this moment.
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