Payne, J.E.; Eddy, J.; Stevenson, H.; Nielson, G.N.; Schultz, S.
Imaging Techniques for 3-Dimensional, Non-Line-of-Sight Structures Fabricated in Silicon Carbide. Metrology 2025, 5, 9.
https://doi.org/10.3390/metrology5010009
AMA Style
Payne JE, Eddy J, Stevenson H, Nielson GN, Schultz S.
Imaging Techniques for 3-Dimensional, Non-Line-of-Sight Structures Fabricated in Silicon Carbide. Metrology. 2025; 5(1):9.
https://doi.org/10.3390/metrology5010009
Chicago/Turabian Style
Payne, Jared E., Joseph Eddy, Hunter Stevenson, Gregory N. Nielson, and Stephen Schultz.
2025. "Imaging Techniques for 3-Dimensional, Non-Line-of-Sight Structures Fabricated in Silicon Carbide" Metrology 5, no. 1: 9.
https://doi.org/10.3390/metrology5010009
APA Style
Payne, J. E., Eddy, J., Stevenson, H., Nielson, G. N., & Schultz, S.
(2025). Imaging Techniques for 3-Dimensional, Non-Line-of-Sight Structures Fabricated in Silicon Carbide. Metrology, 5(1), 9.
https://doi.org/10.3390/metrology5010009