Harris, P.; Østergaard, P.F.; Tabandeh, S.; Söderblom, H.; Kok, G.; van Dijk, M.; Luo, Y.; Pearce, J.; Tucker, D.; Vedurmudi, A.P.;
et al. Measurement Uncertainty Evaluation for Sensor Network Metrology. Metrology 2025, 5, 3.
https://doi.org/10.3390/metrology5010003
AMA Style
Harris P, Østergaard PF, Tabandeh S, Söderblom H, Kok G, van Dijk M, Luo Y, Pearce J, Tucker D, Vedurmudi AP,
et al. Measurement Uncertainty Evaluation for Sensor Network Metrology. Metrology. 2025; 5(1):3.
https://doi.org/10.3390/metrology5010003
Chicago/Turabian Style
Harris, Peter, Peter Friis Østergaard, Shahin Tabandeh, Henrik Söderblom, Gertjan Kok, Marcel van Dijk, Yuhui Luo, Jonathan Pearce, Declan Tucker, Anupam Prasad Vedurmudi,
and et al. 2025. "Measurement Uncertainty Evaluation for Sensor Network Metrology" Metrology 5, no. 1: 3.
https://doi.org/10.3390/metrology5010003
APA Style
Harris, P., Østergaard, P. F., Tabandeh, S., Söderblom, H., Kok, G., van Dijk, M., Luo, Y., Pearce, J., Tucker, D., Vedurmudi, A. P., & Iturrate-Garcia, M.
(2025). Measurement Uncertainty Evaluation for Sensor Network Metrology. Metrology, 5(1), 3.
https://doi.org/10.3390/metrology5010003