Akbar, G.; Di Fatta, A.; Rizzo, G.; Ala, G.; Romano, P.; Imburgia, A.
Comprehensive Review of Wide-Bandgap (WBG) Devices: SiC MOSFET and Its Failure Modes Affecting Reliability. Physchem 2025, 5, 10.
https://doi.org/10.3390/physchem5010010
AMA Style
Akbar G, Di Fatta A, Rizzo G, Ala G, Romano P, Imburgia A.
Comprehensive Review of Wide-Bandgap (WBG) Devices: SiC MOSFET and Its Failure Modes Affecting Reliability. Physchem. 2025; 5(1):10.
https://doi.org/10.3390/physchem5010010
Chicago/Turabian Style
Akbar, Ghulam, Alessio Di Fatta, Giuseppe Rizzo, Guido Ala, Pietro Romano, and Antonino Imburgia.
2025. "Comprehensive Review of Wide-Bandgap (WBG) Devices: SiC MOSFET and Its Failure Modes Affecting Reliability" Physchem 5, no. 1: 10.
https://doi.org/10.3390/physchem5010010
APA Style
Akbar, G., Di Fatta, A., Rizzo, G., Ala, G., Romano, P., & Imburgia, A.
(2025). Comprehensive Review of Wide-Bandgap (WBG) Devices: SiC MOSFET and Its Failure Modes Affecting Reliability. Physchem, 5(1), 10.
https://doi.org/10.3390/physchem5010010