Contactless Determination of Electric Field in Metal–Insulator–Semiconductor Interfaces by Using Constant DC-Reflectivity Photoreflectance
Kobayashi, E.; Satta, K.; Inoue, R.; Suzuki, K.; Makino, T. Contactless Determination of Electric Field in Metal–Insulator–Semiconductor Interfaces by Using Constant DC-Reflectivity Photoreflectance. Solids 2021, 2, 129-138. https://doi.org/10.3390/solids2020008
Kobayashi E, Satta K, Inoue R, Suzuki K, Makino T. Contactless Determination of Electric Field in Metal–Insulator–Semiconductor Interfaces by Using Constant DC-Reflectivity Photoreflectance. Solids. 2021; 2(2):129-138. https://doi.org/10.3390/solids2020008
Chicago/Turabian StyleKobayashi, Eiichi, Koya Satta, Ryoga Inoue, Ken Suzuki, and Takayuki Makino. 2021. "Contactless Determination of Electric Field in Metal–Insulator–Semiconductor Interfaces by Using Constant DC-Reflectivity Photoreflectance" Solids 2, no. 2: 129-138. https://doi.org/10.3390/solids2020008