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Article

Contactless Determination of Electric Field in Metal–Insulator–Semiconductor Interfaces by Using Constant DC-Reflectivity Photoreflectance

1
Advanced Interdisciplinary Science and Technology, Graduate School of Engineering, University of Fukui, Fukui 910-8507, Japan
2
Department of Electric and Electronics Engineering, University of Fukui, Fukui 910-8507, Japan
3
Research Center for Development of Far-Infrared Region, University of Fukui, Fukui 910-8507, Japan
*
Author to whom correspondence should be addressed.
Academic Editors: Michael Reshchikov and Joaquim Carneiro
Solids 2021, 2(2), 129-138; https://doi.org/10.3390/solids2020008
Received: 11 February 2021 / Revised: 11 March 2021 / Accepted: 21 March 2021 / Published: 29 March 2021
(This article belongs to the Special Issue Feature Papers of Solids 2021)
We applied photoreflectance (PR) spectroscopy for contactless determination of the electric field strength at buried interfaces in metal–insulator–semiconductor (MIS) structures. The PR is an all-optical version of an electromodulated reflectance spectroscopy. The tradeoff of this adoption is that this requires an additional feedback system to eliminate background problems induced by scattered pump light and/or photoluminescence. A microcomputer-based feedback system has been developed for this elimination. Despite the very tiny signal intensity, we successfully attained a sufficiently good signal–noise ratio to determine the electric field strength in oxide-based MIS interfaces that exhibits a large, unwanted photoluminescence signal. The field strength was evaluated to be ca. 0.25 kV/cm. View Full-Text
Keywords: optical properties; interface science; instrumentation optical properties; interface science; instrumentation
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MDPI and ACS Style

Kobayashi, E.; Satta, K.; Inoue, R.; Suzuki, K.; Makino, T. Contactless Determination of Electric Field in Metal–Insulator–Semiconductor Interfaces by Using Constant DC-Reflectivity Photoreflectance. Solids 2021, 2, 129-138. https://doi.org/10.3390/solids2020008

AMA Style

Kobayashi E, Satta K, Inoue R, Suzuki K, Makino T. Contactless Determination of Electric Field in Metal–Insulator–Semiconductor Interfaces by Using Constant DC-Reflectivity Photoreflectance. Solids. 2021; 2(2):129-138. https://doi.org/10.3390/solids2020008

Chicago/Turabian Style

Kobayashi, Eiichi, Koya Satta, Ryoga Inoue, Ken Suzuki, and Takayuki Makino. 2021. "Contactless Determination of Electric Field in Metal–Insulator–Semiconductor Interfaces by Using Constant DC-Reflectivity Photoreflectance" Solids 2, no. 2: 129-138. https://doi.org/10.3390/solids2020008

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