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Lai T-Y, Wang I-C, Lee Y-K, Lien W-C, Peng Y-T, Chen K-C, Chen Y-T, Chuang Y-P, Cheng Y-P, Lin Y-C, et al. Multi-Level Feature-Matching System for Counterfeit Seal Image Recognition. Engineering Proceedings. 2026; 128(1):34. https://doi.org/10.3390/engproc2026128034

Lai, Tsung-Yueh, I-Chau Wang, Yin-Kuan Lee, Wei-Cheng Lien, Yan-Tsung Peng, Kuan-Chun Chen, Yuan-Te Chen, Ya-Ping Chuang, Yu-Ping Cheng, Ya-Chi Lin, and et al. 2026. "Multi-Level Feature-Matching System for Counterfeit Seal Image Recognition" Engineering Proceedings 128, no. 1: 34. https://doi.org/10.3390/engproc2026128034

Lai, T.-Y., Wang, I.-C., Lee, Y.-K., Lien, W.-C., Peng, Y.-T., Chen, K.-C., Chen, Y.-T., Chuang, Y.-P., Cheng, Y.-P., Lin, Y.-C., & Shie, P.-H. (2026). Multi-Level Feature-Matching System for Counterfeit Seal Image Recognition. Engineering Proceedings, 128(1), 34. https://doi.org/10.3390/engproc2026128034