Lai, T.-Y.; Wang, I.-C.; Lee, Y.-K.; Lien, W.-C.; Peng, Y.-T.; Chen, K.-C.; Chen, Y.-T.; Chuang, Y.-P.; Cheng, Y.-P.; Lin, Y.-C.;
et al. Multi-Level Feature-Matching System for Counterfeit Seal Image Recognition. Eng. Proc. 2026, 128, 34.
https://doi.org/10.3390/engproc2026128034
AMA Style
Lai T-Y, Wang I-C, Lee Y-K, Lien W-C, Peng Y-T, Chen K-C, Chen Y-T, Chuang Y-P, Cheng Y-P, Lin Y-C,
et al. Multi-Level Feature-Matching System for Counterfeit Seal Image Recognition. Engineering Proceedings. 2026; 128(1):34.
https://doi.org/10.3390/engproc2026128034
Chicago/Turabian Style
Lai, Tsung-Yueh, I-Chau Wang, Yin-Kuan Lee, Wei-Cheng Lien, Yan-Tsung Peng, Kuan-Chun Chen, Yuan-Te Chen, Ya-Ping Chuang, Yu-Ping Cheng, Ya-Chi Lin,
and et al. 2026. "Multi-Level Feature-Matching System for Counterfeit Seal Image Recognition" Engineering Proceedings 128, no. 1: 34.
https://doi.org/10.3390/engproc2026128034
APA Style
Lai, T.-Y., Wang, I.-C., Lee, Y.-K., Lien, W.-C., Peng, Y.-T., Chen, K.-C., Chen, Y.-T., Chuang, Y.-P., Cheng, Y.-P., Lin, Y.-C., & Shie, P.-H.
(2026). Multi-Level Feature-Matching System for Counterfeit Seal Image Recognition. Engineering Proceedings, 128(1), 34.
https://doi.org/10.3390/engproc2026128034
