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Journal: Eng, 2025
Volume: 6
Number: 139
Article:
Efficient Wideband Characterization of Low-Height RF Substrates Using a Destructive Measurement Approach
Authors:
by
Georges Zakka El Nashef, Abdel Karim Abdel Karim and Sawsan Sadek
Link:
https://www.mdpi.com/2673-4117/6/7/139
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