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Journal: Electron. Mater., 2024
Volume: 5
Number: 7

Article: Review on Power Cycling Reliability of SiC Power Device
Authors: by Xu Gao, Qiang Jia, Yishu Wang, Hongqiang Zhang, Limin Ma, Guisheng Zou and Fu Guo
Link: https://www.mdpi.com/2673-3978/5/2/7

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