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Journal: Electronic MaterialsVolume: 5Number: 7
Article: Review on Power Cycling Reliability of SiC Power Device
  • Authors:
  • Xu Gao1,
  • Qiang Jia1,2,* and
  • Yishu Wang1
  • et al.
Link: https://www.mdpi.com/2673-3978/5/2/7

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