Wu, T.; Li, H.; Zhang, C.; Yu, J.; Liu, J.; Zheng, Z.; Duan, B.; Sun, A.; Ju, B.
Multi-Channel Wide-Spectrum High-Resolution Spectrometer for Thin-Film Thickness Measurement. Optics 2025, 6, 55.
https://doi.org/10.3390/opt6040055
AMA Style
Wu T, Li H, Zhang C, Yu J, Liu J, Zheng Z, Duan B, Sun A, Ju B.
Multi-Channel Wide-Spectrum High-Resolution Spectrometer for Thin-Film Thickness Measurement. Optics. 2025; 6(4):55.
https://doi.org/10.3390/opt6040055
Chicago/Turabian Style
Wu, Tong, Haopeng Li, Chuan Zhang, Jingwei Yu, Jianjun Liu, Zepei Zheng, Bosong Duan, Anyu Sun, and Bingfeng Ju.
2025. "Multi-Channel Wide-Spectrum High-Resolution Spectrometer for Thin-Film Thickness Measurement" Optics 6, no. 4: 55.
https://doi.org/10.3390/opt6040055
APA Style
Wu, T., Li, H., Zhang, C., Yu, J., Liu, J., Zheng, Z., Duan, B., Sun, A., & Ju, B.
(2025). Multi-Channel Wide-Spectrum High-Resolution Spectrometer for Thin-Film Thickness Measurement. Optics, 6(4), 55.
https://doi.org/10.3390/opt6040055
