Scan-Strategy Dependent Microstructural Modulation in L-PBF Ti-6Al-4V Components Through Selective Rescanning
Abstract
1. Introduction
2. Materials and Methodology
2.1. Sample Fabrication
2.2. Microstructural Characterization
2.3. Vickers Microhardness
3. Results and Discussion
3.1. Part Quality
3.2. Microstructural Analysis
3.3. Vickers’ Microhardness
4. Conclusions
- Selective rescanning significantly modulates the local microstructure, including the fraction and thickness of martensitic α′ phase and pore distribution. Despite same rescanning parameters, the extent of change in the microstructure is affected by the scan strategy.
- A higher fraction of α′ martensitic phase was observed in the selectively rescanned samples across all scan strategies. The increased α′ phase fraction stems from the higher cooling rate of selectively rescanned regions during resolidification. A slight coarsening of α′ was also observed due to repeated thermal cycles.
- Selective rescanning enhances microhardness, which correlates well with the microstructural changes. The highest hardness of 387 ± 5 HV was measured in the rescanned regions of samples scanned with the stripes scan strategy.
- Non-rescanned regions in selectively rescanned samples also showed an increase in α′ phase and microhardness depending on the scan strategy. The effects were weaker in the stripes and chess samples compared to the unidirectional samples due to different heat-affected zones.
- The stripes scan strategy was found to be the most effective for tailoring the local microstructure and properties of Ti-6Al-4V specimens through selective rescanning.
Author Contributions
Funding
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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| Element | Ti | Al | V | O | N | C | H | Fe | Y |
|---|---|---|---|---|---|---|---|---|---|
| Mass fraction (%) | Bal. | 5.50–6.75 | 3.50–4.50 | 0.2 | 0.05 | 0.08 | 0.015 | 0.30 | 0.005 |
| Sample | LP (W) | SS (mm/s) | HD (µm) | LT (µm) | EV (J/mm3) | Scan Rotation | Selective Rescanning |
|---|---|---|---|---|---|---|---|
| Unidirectional | 340 | 1250 | 120 | 60 | 38 | 0° | × |
| Stripes | 340 | 1250 | 120 | 60 | 38 | 67° | × |
| Chess | 340 | 1250 | 120 | 60 | 38 | 67° | × |
| Unidirectional-SR | 170 | 1250 | 120 | 60 | 19 | 0° | ✓ |
| Stripes-SR | 170 | 1250 | 120 | 60 | 19 | 67° | ✓ |
| Chess-SR | 170 | 1250 | 120 | 60 | 19 | 67° | ✓ |
| Sample | Relative Density (%) | Selective Rescanning |
|---|---|---|
| Unidirectional | 99.57 ± 0.07 | × |
| Stripes | 99.58 ± 0.10 | × |
| Chess | 99.48 ± 0.13 | × |
| Unidirectional-SR | 99.43 ± 0.10 | ✓ |
| Stripes-SR | 99.73 ± 0.06 | ✓ |
| Chess-SR | 99.55 ± 0.14 | ✓ |
| Sample | Martensitic α′ Fraction (%) | Martensitic α′ Thickness (µm) | ||
|---|---|---|---|---|
| Non-Rescanned Region | Rescanned Region | Non-Rescanned Region | Rescanned Region | |
| Unidirectional | 22 ± 1.5 | - | 0.66 ± 0.11 | - |
| Stripes | 34 ± 2.5 | 0.46 ± 0.09 | ||
| Chess | 29 ± 2.1 | 0.64 ± 0.13 | ||
| Unidirectional-SR | 28 ± 2.2 | 36 ± 1.2 | 0.52 ± 0.08 | 0.66 ± 0.07 |
| Stripes-SR | 33 ± 1.3 | 43 ± 1.7 | 0.47 ± 0.11 | 0.67 ± 0.11 |
| Chess-SR | 31 ± 0.9 | 33 ± 2.0 | 0.53 ± 0.11 | 0.71 ± 0.15 |
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Nandigama, K.; Ravichander, B.B.; Parikh, Y.; Kumar, G. Scan-Strategy Dependent Microstructural Modulation in L-PBF Ti-6Al-4V Components Through Selective Rescanning. J. Manuf. Mater. Process. 2026, 10, 88. https://doi.org/10.3390/jmmp10030088
Nandigama K, Ravichander BB, Parikh Y, Kumar G. Scan-Strategy Dependent Microstructural Modulation in L-PBF Ti-6Al-4V Components Through Selective Rescanning. Journal of Manufacturing and Materials Processing. 2026; 10(3):88. https://doi.org/10.3390/jmmp10030088
Chicago/Turabian StyleNandigama, Kalyan, Bharath Bhushan Ravichander, Yash Parikh, and Golden Kumar. 2026. "Scan-Strategy Dependent Microstructural Modulation in L-PBF Ti-6Al-4V Components Through Selective Rescanning" Journal of Manufacturing and Materials Processing 10, no. 3: 88. https://doi.org/10.3390/jmmp10030088
APA StyleNandigama, K., Ravichander, B. B., Parikh, Y., & Kumar, G. (2026). Scan-Strategy Dependent Microstructural Modulation in L-PBF Ti-6Al-4V Components Through Selective Rescanning. Journal of Manufacturing and Materials Processing, 10(3), 88. https://doi.org/10.3390/jmmp10030088

