Consani, C.; Söllradl, T.; Ranacher, C.; Tortschanoff, A.; Rauter, L.; Pühringer, G.; Grille, T.; Irsigler, P.; Jakoby, B.
Sensitivity Comparison of Integrated Mid-Infrared Silicon-Based Photonic Detectors. Proceedings 2018, 2, 796.
https://doi.org/10.3390/proceedings2130796
AMA Style
Consani C, Söllradl T, Ranacher C, Tortschanoff A, Rauter L, Pühringer G, Grille T, Irsigler P, Jakoby B.
Sensitivity Comparison of Integrated Mid-Infrared Silicon-Based Photonic Detectors. Proceedings. 2018; 2(13):796.
https://doi.org/10.3390/proceedings2130796
Chicago/Turabian Style
Consani, Cristina, Thomas Söllradl, Christian Ranacher, Andreas Tortschanoff, Lukas Rauter, Gerald Pühringer, Thomas Grille, Peter Irsigler, and Bernhard Jakoby.
2018. "Sensitivity Comparison of Integrated Mid-Infrared Silicon-Based Photonic Detectors" Proceedings 2, no. 13: 796.
https://doi.org/10.3390/proceedings2130796
APA Style
Consani, C., Söllradl, T., Ranacher, C., Tortschanoff, A., Rauter, L., Pühringer, G., Grille, T., Irsigler, P., & Jakoby, B.
(2018). Sensitivity Comparison of Integrated Mid-Infrared Silicon-Based Photonic Detectors. Proceedings, 2(13), 796.
https://doi.org/10.3390/proceedings2130796
