Next Article in Journal
Studies on Application of Ion Beam Breeding to Industrial Microorganisms at TIARA
Previous Article in Journal
Localization of Aluminum in Epidermal Cells of Mature Tea Leaves
Previous Article in Special Issue
Materials and Life Science with Quantum Beams at the Japan Proton Accelerator Research Complex
Article Menu

Export Article

Open AccessArticle

Experimental Setup of the Fast Current Controller for the Buenos Aires Heavy Ion Microbeam

1
Gerencia de Investigación y Aplicaciones, CNEA, Av Gral Paz 1499, San Martin, B1650HMQ Buenos Aires, Argentina
2
Escuela de Ciencia y Tecnología, Universidad Nacional de San Martín (UNSAM), San Martín, B1650HMQ Buenos Aires, Argentina
3
Consejo Nacional de Investigaciones Científicas y Tecnológicas (CONICET), Rivadavia 1917, C1033AAJ Ciudad de Buenos Aires, Argentina
*
Author to whom correspondence should be addressed.
Quantum Beam Sci. 2019, 3(2), 10; https://doi.org/10.3390/qubs3020010
Received: 9 April 2019 / Revised: 17 May 2019 / Accepted: 27 May 2019 / Published: 3 June 2019
(This article belongs to the Collection Facilities)
  |  
PDF [5121 KB, uploaded 4 June 2019]
  |  

Abstract

Recently we used the heavy ion microprobe of the Buenos Aires TANDAR Laboratory for Single Event Effects (SEE) and Total Dose (TD) experiments in electronics devices and components, requiring very low beam currents. The facility includes a fast beam switch that allows the control of the ion beam current and a mobile Si PIN (p-type, intrinsic, n-type) diode that directly measures the number of ions hitting the device. The fast beam deflector was used to reduce the current by producing a pulsed beam or generating a quasi-continuous (Poisson-like distributed) beam with currents ranging from tens to hundreds of ions/s. As an application for this current control method we present a single event effect (SEE) pulses map generated by a 32S8+ beam at 75 MeV on two 0.5 µm technology CMOS digital output buffers where the device was formed by cascading four CMOS inverters with increasing sizes from input to output to drive large loads. Using the same concept of pulse width modulated deflection, we developed a novel gradient scanning method. This system allows to produce in a single irradiation a distribution with a cumulative damage with a difference of two orders of magnitude at constant gradient. To demonstrate the method, we irradiated a lithium niobate monocrystal with 32S8+ beam at 75 MeV energy and later analyzed the produced damage by the micro-Raman technique and an optical profilometer. View Full-Text
Keywords: particle beam attenuator; electrostatic deflector; ion microbeam particle beam attenuator; electrostatic deflector; ion microbeam
Figures

Figure 1

This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).
SciFeed
Printed Edition Available!
A printed edition of this Special Issue is available here.

Share & Cite This Article

MDPI and ACS Style

Vega, N.A.; Müller, N.A.; de la Fourniére, E.; Halac, E.B.; Debray, M.E. Experimental Setup of the Fast Current Controller for the Buenos Aires Heavy Ion Microbeam. Quantum Beam Sci. 2019, 3, 10.

Show more citation formats Show less citations formats

Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Article Metrics

Article Access Statistics

1

Comments

[Return to top]
Quantum Beam Sci. EISSN 2412-382X Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
Back to Top