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Quantitative Scanning Laue Diffraction Microscopy: Application to the Study of 3D Printed Nickel-Based Superalloys

1
Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, China
2
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
*
Authors to whom correspondence should be addressed.
Quantum Beam Sci. 2018, 2(2), 13; https://doi.org/10.3390/qubs2020013
Received: 6 April 2018 / Revised: 18 May 2018 / Accepted: 4 June 2018 / Published: 5 June 2018
(This article belongs to the Special Issue Strain, Stress and Texture Analysis with Quantum Beams)
Progress in computing speed and algorithm efficiency together with advances in area detector and X-ray optics technologies have transformed the technique of synchrotron radiation-based scanning Laue X-ray microdiffraction. It has now evolved into a near real-time quantitative imaging tool for material structure and deformation at the micrometer and nanometer scales. We will review the achievements of this technique at the Advanced Light Source (Berkeley, CA, USA), and demonstrate its application in the thorough microstructural investigations of laser-assisted 3D printed nickel-based superalloys. View Full-Text
Keywords: Laue diffraction; microdiffraction; synchrotron; strain/stress measurements; microstructure imaging; nickel-based superalloys Laue diffraction; microdiffraction; synchrotron; strain/stress measurements; microstructure imaging; nickel-based superalloys
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Zhou, G.; Kou, J.; Li, Y.; Zhu, W.; Chen, K.; Tamura, N. Quantitative Scanning Laue Diffraction Microscopy: Application to the Study of 3D Printed Nickel-Based Superalloys. Quantum Beam Sci. 2018, 2, 13.

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