BOOLE: Iterative Engineering Design and Prototype Demonstration of a Modular AI-Assisted Electronics Learning Platform
Abstract
1. Introduction
Related Work and Research Gap
2. Materials and Methods
2.1. Iterative Design Strategy
2.2. Requirements, Constraints, and Traceability
2.3. Modular System Architecture
2.4. Component-Selection Iterations and Trade-Offs
2.4.1. Computing Platform
2.4.2. Camera and Display
2.4.3. PCB Toolchain
2.5. Circuit, Schematic, and PCB Development
2.5.1. Progressive Circuit Selection
2.5.2. Simulation and Schematic Capture
2.5.3. Layout and Manufacturability Decisions
2.6. Mechanical Enclosure and Serviceability
2.7. AI and User-Interface Co-Design
2.7.1. Classification Pipeline
2.7.2. Part Number and Datasheet Workflow
2.8. Verification Protocol
2.8.1. Circuit and PCB Verification
2.8.2. AI and Complete-System Verification
2.8.3. Pilot User Evaluation
3. Results
3.1. Design Iterations and Resulting Architecture
3.2. Simulation-to-Hardware Realization
3.3. PCB, Enclosure, and Complete-System Integration
3.4. AI Validation and End-to-End Operation
3.5. Pilot Student Perception Results
4. Discussion
4.1. Design Value of the Modular Architecture
4.2. Trade-Offs
4.3. Safety, Standards, and Sustainability
4.4. Comparison with Named Alternative Learning Platforms
4.5. Limitations and Next Validation Steps
5. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
Abbreviations
| AI | Artificial Intelligence |
| CSI | Camera Serial Interface |
| DRC | Design Rule Check |
| FR-4 | Flame-Retardant Glass-Reinforced Epoxy Laminate |
| GPIO | General Purpose Input/Output |
| IRB | Institutional Review Board |
| PCB | Printed Circuit Board |
| QFD | Quality Function Deployment |
| UI | User Interface |
| ViT | Vision Transformer |
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| ID | Design Requirement | Principal Constraint/Driver | Implemented Response | Verification Evidence |
|---|---|---|---|---|
| R1 | Progressive topic coverage | Novice cognitive load; finite panel area | Separate analog, combinational, and sequential faces with ordered activities | Implemented-circuit inventory; complete face operation |
| R2 | Immediate and interpretable feedback | Minimal external instruments | LEDs, counters, seven-segment displays, adjustable inputs, and selected waveform outputs | Truth-state and analog-behavior checks |
| R3 | Portable, self-contained operation | Classroom transport and desk use | Four-face cube containing PCBs, display, camera, controllers, and wiring | Integrated prototype assembly |
| R4 | Maintainability and modularity | Repeated cohort use; localized faults | Removable PCB panels, headers, labeled signals, replaceable components, and separable AI subsystem | Module-level bring-up and replacement access |
| R5 | Controlled power and low idle consumption | Three learning PCBs share a source | Master face switches plus per-circuit shunt jumpers; only selected circuits are energized | Selective-power functional test |
| R6 | Manufacturable PCB realization | Panel density; footprint availability; two-layer fabrication | OrCAD schematics, Allegro constraint-driven placement/routing, ground plane, vias, DRC, Gerber and drill outputs | DRC closure, 3D fit review, fabrication and assembly |
| R7 | Accessible component information | Marking size; changing part inventory; intermittent network | Camera-based class recognition, part-number extraction, editable result, and local datasheet repository | Class-wise validation and end-to-end UI tests |
| R8 | Safe educational interaction | Novice users and exposed controls | Low-voltage circuits, current-limiting resistors, isolated active modules, enclosure retention, ventilation, and documented operation | Visual inspection and powered functional testing |
| R9 | Scalability | Future mixed-signal and programmable-logic content | Face-level interfaces and replaceable panels; software layers separated by function | Architecture review and defined expansion interfaces |
| Face | Activity | Physical Behavior/Path | Controller Measurement | Software Calculation | Learner Display |
|---|---|---|---|---|---|
| Face 1 | Voltage divider | Resistor network at 5 V with R1 = 10 kΩ and selectable R2 | ADC input represents the selected divider state | Maps the selected state to nominal 1.67, 2.50, or 3.33 V | Labeled voltage LED |
| Face 1 | RC charge/discharge | Switched 5 V RC reference topology; selected capacitance is represented in the control input | Reads switch and selection state | Applies the documented 5τ timing rule; for 5 mF and 200 Ω, τ = 1 s | LED persistence; analytical reference in Section 3.2 |
| Face 1 | Diode polarity/threshold | Adjustable input and two indicator branches | Reads the selected input/polarity state | Applies the activity threshold/polarity logic | Mutually exclusive half-cycle LEDs |
| Face 1 | Full-wave rectifier | Complete bridge-and-smoothing reference is simulated; the learning PCB uses controller-driven indicators | Reads the selected input/capacitance setting | Represents conduction path and ripple trend | Bridge-path LEDs and smoothing indicator |
| Face 1 | Transistor switch | Adjustable base-control input and output indicator | Reads the control voltage | Applies the switching threshold | Output LED |
| Face 1 | Transistor amplifier | Transistor topology is instructional; the implemented response is controller-assisted | Reads an amplitude-control input | Maps input level to the demonstrator output | Buzzer/output indication |
| Face 2 | AND/OR/NOT/XOR gates | Discrete transistor/logic networks with manual inputs | Direct hardware path; controller mediation is unnecessary | Truth function is realized by the physical logic network | Direct LED truth state |
| Face 2 | MUX/comparator/adder | Logic ICs and manual binary inputs | Direct hardware path; controller mediation is unnecessary | Selection, comparison, and addition are realized by the logic ICs | LED and/or seven-segment result |
| Face 2 | Counter | Counter/decoder hardware with manual clock/control | Controller support configures activity inputs | Counter/decoder hardware generates the binary and BCD response | Four-bit LEDs and BCD display/blanking |
| Face 3 | Clock divider | Two cascaded 74,175 stages configured as toggles | Arduino provides the adjustable base clock/control settings | Hardware stages produce the F/2 and F/4 outputs | Clock-state LEDs |
| Face 3 | D flip-flop and shift register | Physical flip-flop/register ICs with manual control and staged outputs | Stored-state propagation follows the direct hardware path | Decoder support converts the staged binary state for display | Q/state LEDs and seven-segment display |
| Face 4 | Component-to-datasheet support | Camera captures the physical component | Pi receives the image; no learning-face electrical quantity is measured | ViT classification; cloud part-number extraction; local PDF filename matching | Ranked class score, editable part number, and datasheet PDF |
| Iteration | Trigger/Evidence | Implemented Change | Engineering Effect |
|---|---|---|---|
| Compute platform | AI, camera, and touch UI exceeded microcontroller capability | Initial Raspberry Pi 4 concept updated to Raspberry Pi 5; Arduino retained for deterministic 5 V I/O | Separated application computing from circuit control and simplified learning-face interfaces |
| PCB toolchain | Industrial libraries, review, and fabrication support became available | Candidate KiCad workflow replaced by OrCAD Capture plus Allegro PCB Designer | Reduced netlist/footprint transfer risk and enabled constraint-driven DRC and 3D review |
| Power architecture | Three dense PCBs created idle-load and fault-isolation concerns | Master switch per face plus shunt enable per circuit | Only the selected module is energized; troubleshooting is localized |
| Panel embodiment | Board density and novice navigation competed for area | Activity boundaries, signal labels, and control/output alignment added to silkscreen | The PCB itself became an instructional map without obscuring service labels |
| Enclosure | Integrated electronics required protection and cooling | 3D-printed cube with restrained removable panels and top ventilation opening | Improved portability, alignment, access, and thermal airflow |
| AI workflow | Class labels alone did not support bench decisions | Added structured part-number extraction, user correction, and local PDF lookup | Connected recognition to actionable specifications while keeping uncertainty visible |
| Board bring-up | Visual and powered checks revealed assembly defects | Localized solder rework followed by repeated module tests | Converted a non-working joint into documented assembly feedback before integration |
| Face | Activity Family | Reference/Programmed Criterion | Functional Result | Predefined Criterion for Future Instrumented Validation |
|---|---|---|---|---|
| 1 | Voltage divider | Vin = 5 V; R1 = 10 kΩ; Vout = 1.67, 2.50, 3.33 V for R2 = 5, 10, 20 kΩ | 3/3 expected indicator states obtained (labels: 1.66, 2.50, 3.33 V) | Confirm with calibrated Vout within ±5% over 10 repeated selections/state |
| 1 | RC activity | C = 5 mF; R = 200 Ω; τ = 1.0 s; 5τ = 5.0 s | 2/2 modes showed the intended rise/decay trend and LED persistence | Fit measured τ within ±10% and repeat 10 charge/discharge cycles |
| 1 | Diode/polarity | Input states 0.7, 1.8, and 2.5 V plus reversed polarity | 4/4 programmed indicator states matched the threshold/polarity logic | Confirm forward drop/current and repeat each state 10 times |
| 1 | Full-wave activity | Four-diode bridge reference with selectable smoothing capacitance | Bridge-conduction and smoothing-indicator sequence completed | Measure ripple before/after smoothing; target reduction ≥ 50% at fixed load |
| 1 | Transistor switch/amplifier | Programmed threshold and amplitude-response states | 2/2 activity modes produced the intended LED/buzzer response | Measure switch saturation and amplifier gain over 10 repeated input sweeps |
| 2 | Logic gates | AND, OR, XOR: 4 states each; NOT: 2 states (14 total) | 14/14 truth-table states produced the required LED output | Repeat the 14-state matrix three times and record propagation delay |
| 2 | MUX/comparator/adder | Complete defined selection, comparison, and binary-sum state matrices | Every applied state produced the selected path, relation, or binary output | Repeat each complete matrix three times with zero state errors |
| 2 | Counter/display | 16 binary states; BCD display valid for 0–9 and blank for 10–15 | 16/16 counter states and 10/10 valid BCD symbols followed the defined sequence | Run 10 full cycles with zero missed counts and measure maximum clock rate |
| 3 | Clock divider | Two hardware ratios: F/2 and F/4 | 2/2 divider outputs followed the documented sequence | Confirm ratios within ±1% and duty cycle 50% ± 5% over 10 periods |
| 3 | D flip-flop/register | Preset/clear state table and staged binary propagation | Defined Q/state and decoded-display sequence completed | Repeat the full sequence 10 times and record setup/hold and propagation timing |
| Component Category | Accuracy (%) | Precision (%) | Recall (%) | F1-Score (%) | Balanced Accuracy (%) |
|---|---|---|---|---|---|
| 7-segment display | 97.5 | 100.0 | 75.0 | 85.7 | 87.5 |
| Capacitor | 96.0 | 80.0 | 80.0 | 80.0 | 88.9 |
| Diode | 95.0 | 81.3 | 65.0 | 72.2 | 81.7 |
| Graphical LCD (GLCD) | 99.5 | 100.0 | 95.0 | 97.4 | 97.5 |
| Integrated circuit (IC) | 98.0 | 90.0 | 90.0 | 90.0 | 94.4 |
| LED | 96.5 | 78.3 | 90.0 | 83.7 | 93.6 |
| Potentiometer | 96.0 | 73.1 | 95.0 | 82.6 | 95.6 |
| Relay | 97.0 | 85.0 | 85.0 | 85.0 | 91.7 |
| Resistor | 98.5 | 100.0 | 85.0 | 91.9 | 92.5 |
| Transistor | 91.0 | 54.2 | 65.0 | 59.1 | 79.4 |
| Workflow Stage | Evaluation Basis | Reported Result | Additional Robustness/Benchmark Measure |
|---|---|---|---|
| Component classification | Ten predefined component categories; 2000 original photographs (200 per category); class-wise 80/10/10 training, validation, and final-test split performed before augmentation; augmentation restricted to the training partition. | Ten one-versus-rest ViT-Base classifiers evaluated on untouched final-test data (20 positive and 180 negative images per classifier). Accuracy ranged from 91.0% to 99.5%, precision from 54.2% to 100.0%, recall from 65.0% to 95.0%, F1-score from 59.1% to 97.4%, and balanced accuracy from 79.4% to 97.5%. | Balanced accuracy and binary confusion matrices are included in the present evaluation. Future external testing should use new physical specimens and acquisition sessions with prospectively controlled lighting, background, orientation, distance, camera, and operator conditions. |
| Part-number extraction | Physical component images from the deployed interface | Structured part-number extraction demonstrated with editable user confirmation. | Evaluate exact-string success across additional marked components and document blur, glare, occlusion, and orientation cases. |
| Datasheet retrieval | Local part-number matching and PDF display | Local datasheet lookup demonstrated in the deployed workflow. | Report correct-PDF retrieval rate across a broader cached component library. |
| Human correction | Editable part-number confirmation and re-query path | User correction is available before datasheet retrieval. | Record correction-to-correct-PDF recovery when the extracted part number is inaccurate. |
| Pi 5 end-to-end workflow | Camera -> class -> part number -> confirmation -> lookup -> display | All six functional stages were demonstrated on the Raspberry Pi 5 interface. Design-level benchmark: approximately 7 s end-to-end under stable Wi-Fi (about 2 s capture/local ViT-Base classification, 4 s cloud part-number extraction, and 1 s local lookup/display). | Confirm the latency budget with timestamped repeated runs and log CPU/RAM utilization and network-failure recovery across representative operating conditions. |
| Survey Statement | Yes (%) | No (%) |
|---|---|---|
| BOOLE helped me understand electronics and logic concepts better. | 92 | 8 |
| The hands-on interactive platform made learning more engaging. | 92 | 8 |
| Real-time LEDs and waveform feedback helped link theory to practice. | 95 | 5 |
| The device and interface were user-friendly and easy to use. | 89 | 11 |
| I prefer learning with BOOLE over traditional laboratories. | 92 | 8 |
| I would recommend BOOLE to other students or classes. | 96 | 4 |
| Criterion | Programme Take-Home Kits [7] | Lab in a Box [10] | WinterLab [11] | HELP [12] | BOOLE |
|---|---|---|---|---|---|
| Primary emphasis | Programme-aligned take-home activities | Portable Raspberry Pi-based electronics trainer | Portable integrated experimentation/measurement board | Portable generator/instrument plus functional board and breadboard | Progressive multi-face trainer plus optional AI support |
| Physical topology | Kit selected for programme activities | Trainer functions in a portable enclosure | Open experimentation with integrated instruments | Breadboard plus fixed functional blocks | Dedicated analog, combinational, and sequential PCBs |
| Curricular progression | Explicit programme-level alignment | Activity-level electronics coverage | Inquiry-oriented experimentation | Multi-generation electronics-lab activities | Explicit analog → combinational → sequential face sequence |
| Integrated instrumentation | Varies by kit | Raspberry Pi-based trainer functions | Integrated measurement functions | Portable signal generator and measurement instrument | LEDs/displays; no calibrated instrument suite |
| Maintenance boundary | Not reported as a formal design criterion | Not reported as a face-level boundary | Board-level product | Kit evolved across three generations | Replaceable faces, labeled headers, per-circuit shunts |
| AI component/datasheet aid | Not reported | Not reported | Not reported | Not reported | Optional classifier, editable part number, local PDF cache |
| Reported evaluation | Design and programme-use rationale | Development and initial testing | Design case and engagement rationale | Student surveys and staff focus groups | Functional prototype evidence and aggregate perception pilot |
| Component | Part Number |
|---|---|
| Slide switch | GF-123-0054 |
| 10 kΩ SMD resistor | CRCW040210R0FRED |
| Quadruple D-type flip-flop IC | SN74HC175DR |
| 200 Ω SMD resistor | ERJ-2RKF2000X |
| SMD LED (20 mA) | SML-LX2832 SRCJR |
| 330 Ω SMD resistor | AC0402FR-07330RL |
| 7-segment display | LDS-C512RI |
| BCD/7-segment IC | CD4511BNSR |
| Pin header | 4-103186-0 |
| 2-pin male header | N/A |
| Push button | HP0315AFKP2-R |
| 1 kΩ potentiometer | PT01-D120D-B102 |
| 1-bit flip-flop IC | SN74LVC1G74DCUR |
| XOR gate IC | SN74LVC1G86DCKR |
| NOT gate IC | SN74LVC1G14DBVRE4 |
| AND gate IC | SN74LVC1G08DBVRE4 |
| OR gate IC | SN74LVC1G32DCKRE4 |
| Comparator IC | CD74HC85PW |
| 4-bit adder IC | SN74F283D |
| 1 kΩ SMD resistor | CRCW04021K00FREDC |
| Counter IC | SN74HC193DR |
| Transistor | 2N2222A |
| Diode | 4878-1N4001CTT-ND |
| Buzzer | 2223-CMI-1210-5-95T-ND |
| 68.1 Ω SMD resistor | ERJ-2RKF68R1X |
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© 2026 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license.
Share and Cite
Abdul Kader, H.; Ouayjan, T.; Ghazzawi, H.; Chrakie, A.; El Hassan, M.; Nakad, M. BOOLE: Iterative Engineering Design and Prototype Demonstration of a Modular AI-Assisted Electronics Learning Platform. Designs 2026, 10, 97. https://doi.org/10.3390/designs10050097
Abdul Kader H, Ouayjan T, Ghazzawi H, Chrakie A, El Hassan M, Nakad M. BOOLE: Iterative Engineering Design and Prototype Demonstration of a Modular AI-Assisted Electronics Learning Platform. Designs. 2026; 10(5):97. https://doi.org/10.3390/designs10050097
Chicago/Turabian StyleAbdul Kader, Hamza, Taline Ouayjan, Hazar Ghazzawi, Ali Chrakie, Moustapha El Hassan, and Mantoura Nakad. 2026. "BOOLE: Iterative Engineering Design and Prototype Demonstration of a Modular AI-Assisted Electronics Learning Platform" Designs 10, no. 5: 97. https://doi.org/10.3390/designs10050097
APA StyleAbdul Kader, H., Ouayjan, T., Ghazzawi, H., Chrakie, A., El Hassan, M., & Nakad, M. (2026). BOOLE: Iterative Engineering Design and Prototype Demonstration of a Modular AI-Assisted Electronics Learning Platform. Designs, 10(5), 97. https://doi.org/10.3390/designs10050097

