
Article Menu
- Academic Editor
- Subscribe SciFeed
- Recommended Articles
- Related Info Link
-
More by Authors Links
- on DOAJ
- Rosenzweig, J. B.
- Andonian, G.
- Agustsson, R.
- Anisimov, P. M.
- Araujo, A.
- Bosco, F.
- Carillo, M.
- Chiadroni, E.
- Giannessi, L.
- Huang, Z.
- Fukasawa, A.
- Kim, D.
- Kutsaev, S.
- Lawler, G.
- Li, Z.
- Majernik, N.
- Manwani, P.
- Maxson, J.
- Miao, J.
- Migliorati, M.
- Mostacci, A.
- Musumeci, P.
- Murokh, A.
- Nanni, E.
- O’Tool, S.
- Palumbo, L.
- Robles, R.
- Sakai, Y.
- Simakov, E. I.
- Singleton, M.
- Spataro, B.
- Tang, J.
- Tantawi, S.
- Williams, O.
- Xu, H.
- Yadav, M.
- on Google Scholar
- Rosenzweig, J. B.
- Andonian, G.
- Agustsson, R.
- Anisimov, P. M.
- Araujo, A.
- Bosco, F.
- Carillo, M.
- Chiadroni, E.
- Giannessi, L.
- Huang, Z.
- Fukasawa, A.
- Kim, D.
- Kutsaev, S.
- Lawler, G.
- Li, Z.
- Majernik, N.
- Manwani, P.
- Maxson, J.
- Miao, J.
- Migliorati, M.
- Mostacci, A.
- Musumeci, P.
- Murokh, A.
- Nanni, E.
- O’Tool, S.
- Palumbo, L.
- Robles, R.
- Sakai, Y.
- Simakov, E. I.
- Singleton, M.
- Spataro, B.
- Tang, J.
- Tantawi, S.
- Williams, O.
- Xu, H.
- Yadav, M.
- on PubMed
- Rosenzweig, J. B.
- Andonian, G.
- Agustsson, R.
- Anisimov, P. M.
- Araujo, A.
- Bosco, F.
- Carillo, M.
- Chiadroni, E.
- Giannessi, L.
- Huang, Z.
- Fukasawa, A.
- Kim, D.
- Kutsaev, S.
- Lawler, G.
- Li, Z.
- Majernik, N.
- Manwani, P.
- Maxson, J.
- Miao, J.
- Migliorati, M.
- Mostacci, A.
- Musumeci, P.
- Murokh, A.
- Nanni, E.
- O’Tool, S.
- Palumbo, L.
- Robles, R.
- Sakai, Y.
- Simakov, E. I.
- Singleton, M.
- Spataro, B.
- Tang, J.
- Tantawi, S.
- Williams, O.
- Xu, H.
- Yadav, M.
Need Help?
Order Article Reprints
Journal: Instruments, 2024
Volume: 8
Number: 19
19
Article:
A High-Flux Compact X-ray Free-Electron Laser for Next-Generation Chip Metrology Needs
Authors:
by
James B. Rosenzweig, Gerard Andonian, Ronald Agustsson, Petr M. Anisimov, Aurora Araujo, Fabio Bosco, Martina Carillo, Enrica Chiadroni, Luca Giannessi, Zhirong Huang, Atsushi Fukasawa, Dongsung Kim, Sergey Kutsaev, Gerard Lawler, Zenghai Li, Nathan Majernik, Pratik Manwani, Jared Maxson, Janwei Miao, Mauro Migliorati, Andrea Mostacci, Pietro Musumeci, Alex Murokh, Emilio Nanni, Sean O’Tool, Luigi Palumbo, River Robles, Yusuke Sakai, Evgenya I. Simakov, Madison Singleton, Bruno Spataro, Jingyi Tang, Sami Tantawi, Oliver Williams, Haoran Xu and Monika Yadavadd
Show full author list
remove
Hide full author list
Link:
https://www.mdpi.com/2410-390X/8/1/19
MDPI offers high quality article reprints with convenient shipping to destinations worldwide. Each reprint features a 270 gsm bright white cover
and 105 gsm premium white paper, bound with two stitches for durability and printed in full color. The cover design is customized to your article
and designed to be complimentary to the journal.
Cite
Rosenzweig, J.B.; Andonian, G.; Agustsson, R.; Anisimov, P.M.; Araujo, A.; Bosco, F.; Carillo, M.; Chiadroni, E.; Giannessi, L.; Huang, Z.; et al. A High-Flux Compact X-ray Free-Electron Laser for Next-Generation Chip Metrology Needs. Instruments 2024, 8, 19. https://doi.org/10.3390/instruments8010019
Rosenzweig JB, Andonian G, Agustsson R, Anisimov PM, Araujo A, Bosco F, Carillo M, Chiadroni E, Giannessi L, Huang Z, et al. A High-Flux Compact X-ray Free-Electron Laser for Next-Generation Chip Metrology Needs. Instruments. 2024; 8(1):19. https://doi.org/10.3390/instruments8010019
Chicago/Turabian StyleRosenzweig, James B., Gerard Andonian, Ronald Agustsson, Petr M. Anisimov, Aurora Araujo, Fabio Bosco, Martina Carillo, Enrica Chiadroni, Luca Giannessi, Zhirong Huang, and et al. 2024. "A High-Flux Compact X-ray Free-Electron Laser for Next-Generation Chip Metrology Needs" Instruments 8, no. 1: 19. https://doi.org/10.3390/instruments8010019
APA StyleRosenzweig, J. B., Andonian, G., Agustsson, R., Anisimov, P. M., Araujo, A., Bosco, F., Carillo, M., Chiadroni, E., Giannessi, L., Huang, Z., Fukasawa, A., Kim, D., Kutsaev, S., Lawler, G., Li, Z., Majernik, N., Manwani, P., Maxson, J., Miao, J., ... Yadav, M. (2024). A High-Flux Compact X-ray Free-Electron Laser for Next-Generation Chip Metrology Needs. Instruments, 8(1), 19. https://doi.org/10.3390/instruments8010019