Development of a Cherenkov-Based Time-of-Flight Detector Using Silicon Photomultipliers
Abstract
1. Introduction
2. Materials and Methods
- In the cluster core, where many photoelectrons are expected, the pixel with maximum charge yields the best intrinsic time resolution and the lowest time jitter.
- By combining the timestamps of those SiPMs in the cluster core with a sufficiently high number of photoelectrons, the overall time precision could be further improved.
2.1. Candidate Radiator Materials
2.2. Contributions to the Time Resolution
- Geometric Spread, : Photons travel different paths from the emission point to the sensor. For a radiator of thickness d and normally incident charged particles, the maximum time spread is , leading to a contribution to the resolution . This term also accounts for the chromatic dispersion of the radiator in the spectral region to which the SiPMs are sensitive, with the wavelength dependence of broadening the arrival time distribution.
- Intrinsic SiPM Jitter, : This contribution originates from the stochastic nature of photoelectron creation, charge multiplication [11], and the spread in the charge transit time across multiple SPADs. For SiPMs with a given SPTR, the intrinsic time resolution depends on the number of photoelectrons as . Both the SPTR and improve with the increasing operating overvoltage. Moreover, SPTR depends on the total capacitance of the SiPM, which is proportional to the area of the photosensitive part of the SiPM and the number of SPADs.
- Front-End Jitter, : This term accounts for the time uncertainty introduced by the front-end electronics in the timestamp reconstruction. It is primarily driven by the electronic noise and by the finite signal rise time: noise causes fluctuations in the time pick-off (e.g., threshold crossing), and the effect is larger when the signal slope at the pick-off point is smaller. Since the signal amplitude and slope scale with the collected charge, this contribution scales approximately as . The decreases with increasing pre-amplifier gain and decreasing discriminator threshold.
- TDC Quantization Uncertainty, : This term accounts for the finite time binning of the TDC. Assuming a uniform quantization error within one bin, the corresponding contribution is , where LSB is the least significant bit.
2.3. Monte Carlo Simulation Optimization Studies
2.4. Photon Reflections at the SiPM Interface
2.5. Beam Test Measurement Campaigns
2.5.1. Tested SiPM Arrays
2.5.2. The SiPM Array Telescope
2.5.3. SiPM Cooling and Temperature Monitoring
2.5.4. Cabling of the SiPMs to the Front-End
2.5.5. SiPM Readout Electronics
The Petiroc Board
The RadioPico Board
2.5.6. Overvoltage and Threshold
2.5.7. Event Selection
2.5.8. Charge and Time Calibration
3. Results
3.1. SiPM Reflectance Measurements and ARC Optimization Studies
3.2. Window Cluster Topology and Charge
3.3. Charged-Particle Detection Efficiency
3.4. Time Resolution
3.4.1. Analysis Using Channels with Maximum Charge
3.4.2. Analysis Using the Cluster Mean Time
3.5. Comparison with a Bare SiPM Array
4. Discussion
5. Conclusions
Author Contributions
Funding
Data Availability Statement
Acknowledgments
Conflicts of Interest
Abbreviations
| ADC | Analog-to-Digital Converter |
| DAQ | Data Acquisition |
| FEB | Front-End Board |
| FF | Fill Factor |
| IF | Integration Factor |
| LSB | Least Significant Bit |
| LUT | Lookup Table |
| MPPC | Multi-Pixel Photon Counter |
| NaF | Sodium Fluoride |
| PE | Photoelectron |
| PDE | Photom Detection Efficiency |
| PID | Particle Identification |
| RICH | Ring-Imaging Cherenkov |
| SPAD | Single-Photon Avalanche Diode |
| SiPM | Silicon Photomultiplier |
| TOF | Time of Flight |
| ToA | Time of Arrival |
| ToT | Time over Threshold |
Appendix A. Modeling the SiPM Reflectance
- Only specular reflection with occurs at the smooth interfaces between gas and resin, gas and window, and window and resin.
- Only specular reflection occurs at the resin–ARC–passivation–silicon interfaces within the active area, corresponding to a fraction of the array area.
- Only diffuse reflection occurs in the dead area within any SiPM, corresponding to a fraction of the array area.
- Only diffuse reflection occurs in the dead area between adjacent SiPMs, corresponding to a fraction of the array area.
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| Array Model | Number of SiPMs | Array Size (mm2) | SiPM Size (mm2) | SPAD Pitch (µm) | Resin Layer | Window Material | FF (%) | IF (%) |
|---|---|---|---|---|---|---|---|---|
| S13361 2050 | 17.817.8 | 50 | Epoxy | — | 74 | 83 | ||
| S13361 3050 | 25.825.8 | 50 | Epoxy | — | 74 | 88 | ||
| S13361 3075 | 25.825.8 | 75 | Epoxy | — | 82 | 88 | ||
| S13361 3075 | 25.825.8 | 75 | Silicone | SiO2 | 82 | 88 | ||
| S13361 3075 | 25.825.8 | 75 | Silicone | High-n | 82 | 88 |
| Array Model | Number of SiPMs | Array Size (mm2) | SiPM Pitch (mm2) | SiPM Size (mm2) | SPAD Pitch (µm) | Resin Layer | Window Material | Window Thickness (mm) |
|---|---|---|---|---|---|---|---|---|
| S13361 1350 | 12.2 × 12.2 | 50 | Epoxy | SiO2 | 2 | |||
| S13361 2050 | 17.8 × 17.8 | 50 | Epoxy | SiO2 | 1 | |||
| S13361 3075 | 25.8 × 25.8 | 75 | Silicone | SiO2 | 1 | |||
| S13361 3075 | 25.8 × 25.8 | 75 | Silicone | MgF2 | 1 | |||
| S13361 3075 | 25.8 × 25.8 | 75 | Epoxy | — | — |
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Congedo, L.; De Robertis, G.; Di Mauro, A.; Giliberti, M.; Licciulli, F.; Liguori, A.; Liotino, R.; Lorusso, L.; Mazziotta, M.N.; Nappi, E.; et al. Development of a Cherenkov-Based Time-of-Flight Detector Using Silicon Photomultipliers. Instruments 2026, 10, 28. https://doi.org/10.3390/instruments10020028
Congedo L, De Robertis G, Di Mauro A, Giliberti M, Licciulli F, Liguori A, Liotino R, Lorusso L, Mazziotta MN, Nappi E, et al. Development of a Cherenkov-Based Time-of-Flight Detector Using Silicon Photomultipliers. Instruments. 2026; 10(2):28. https://doi.org/10.3390/instruments10020028
Chicago/Turabian StyleCongedo, Liliana, Giuseppe De Robertis, Antonio Di Mauro, Mario Giliberti, Francesco Licciulli, Antonio Liguori, Rocco Liotino, Leonarda Lorusso, Mario Nicola Mazziotta, Eugenio Nappi, and et al. 2026. "Development of a Cherenkov-Based Time-of-Flight Detector Using Silicon Photomultipliers" Instruments 10, no. 2: 28. https://doi.org/10.3390/instruments10020028
APA StyleCongedo, L., De Robertis, G., Di Mauro, A., Giliberti, M., Licciulli, F., Liguori, A., Liotino, R., Lorusso, L., Mazziotta, M. N., Nappi, E., Nicassio, N., Panzarini, G., Pillera, R., & Volpe, G. (2026). Development of a Cherenkov-Based Time-of-Flight Detector Using Silicon Photomultipliers. Instruments, 10(2), 28. https://doi.org/10.3390/instruments10020028

